LEADER 01960oam  2200529zu 450 
001 996203252703316
005 20210806235820.0
010   $a1-5090-9966-2
035   $a(CKB)1000000000022680
035   $a(SSID)ssj0000393789
035   $a(PQKBManifestationID)12146523
035   $a(PQKBTitleCode)TC0000393789
035   $a(PQKBWorkID)10379647
035   $a(PQKB)11628652
035   $a(EXLCZ)991000000000022680
100   $a20160829d2005      uy              
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$aASICON 2005 : 2005, 6th International Conference on ASIC proceedings, Shanghai, China, October 24-27, 2005
210 31$a[Place of publication not identified]$cIEEE Operations Center$d2005
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-9210-8 
606   $aApplication specific integrated circuits$xDesign and construction$vCongresses
606   $aComputer-aided design$xTesting$vCongresses
606   $aApplication specific integrated circuits$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aApplication specific integrated circuits$xDesign and construction
615  0$aComputer-aided design$xTesting
615  0$aApplication specific integrated circuits
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815
702   $aTang$b Ting-Ao
702   $aTang$b Ting-Ao
702   $aHuang$b Yumei
712 02$aZhongguo dian zi xue hui
712 12$aInternational Conference on ASIC
801  0$bPQKB
906   $aPROCEEDING
912   $a996203252703316
996   $aASICON 2005 : 2005, 6th International Conference on ASIC proceedings, Shanghai, China, October 24-27, 2005$92496835
997   $aUNISA