LEADER 02050oam 2200541zu 450 001 996203009603316 005 20210807003700.0 010 $a1-4244-6026-3 035 $a(CKB)2400000000002664 035 $a(SSID)ssj0001679730 035 $a(PQKBManifestationID)16489667 035 $a(PQKBTitleCode)TC0001679730 035 $a(PQKBWorkID)15014117 035 $a(PQKB)11466052 035 $a(EXLCZ)992400000000002664 100 $a20160829d2010 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aDELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam 210 31$a[Place of publication not identified]$cIEEE Computer Society$d2010 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-4244-6025-5 311 $a0-7695-3978-5 606 $aElectronics$xResearch$vCongresses 606 $aElectronics$xDesign$vCongresses 606 $aElectronics$xTesting$vCongresses 606 $aElectrical Engineering$2HILCC 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aElectronics$xResearch 615 0$aElectronics$xDesign 615 0$aElectronics$xTesting 615 7$aElectrical Engineering 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 676 $a621.381 712 02$aIEEE Computer Society 712 02$aIEEE Computer Society Technical Council on Test Technology. 712 02$a£òai hòoc quâãoc gia TP Háão Châi Minh 712 02$aIEEE Vietnam Section 712 12$aIEEE International Symposium on Electronic Design, Test and Applications 801 0$bPQKB 906 $aPROCEEDING 912 $a996203009603316 996 $aDELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam$92415597 997 $aUNISA