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200 10$a2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
210 31$a[Place of publication not identified]$cIEEE Society$d2003
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-8157-2 
606   $aIntegrated circuits$xReliability$vCongresses
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615  7$aEngineering & Applied Sciences
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712 02$aIEEE Electron Devices Society
712 12$aInternational Integrated Reliability Workshop
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996   $a2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003$92537841
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