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200 10$aInternational Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA
210 31$a[Place of publication not identified]$cInternational Test Conference$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-8580-2 
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615  7$aEngineering & Applied Sciences
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712 02$aIEEE Computer Society Test Technology Technical Committee
712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section.
712 12$aInternational Test Conference
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