LEADER 01159nam  2200373   450 
001 996202087403316
005 20180328124404.0
010   $a1-5090-9292-7
035   $a(CKB)1000000000331041
035   $a(WaSeSS)IndRDA00096765
035   $a(EXLCZ)991000000000331041
100   $a20180328d2007      ||             |
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aMTV '06 $eseventh International Workshop on Microprocessor Test and Verification : 4-5 December 2006
210  1$aNew York :$cIEEE,$d2007.
215   $a1 online resource (99 pages)
300   $aIncludes index.
311   $a0-7695-2839-2 
606   $aMicroprocessors$xTesting$vCongresses
606   $aIntegrated circuits$xTesting$vCongresses
606   $aIntegrated circuits$xVerification$vCongresses
615  0$aMicroprocessors$xTesting
615  0$aIntegrated circuits$xTesting
615  0$aIntegrated circuits$xVerification
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a996202087403316
996   $aMTV '06$92376457
997   $aUNISA