LEADER 01159nam 2200337 450 001 996201321603316 005 20180306202925.0 035 $a(CKB)2400000000002982 035 $a(WaSeSS)IndRDA00093694 035 $a(EXLCZ)992400000000002982 100 $a20180306d2009 || | 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2009 ROCS Workshop $eproceedings : October 11, 2009, Greensboro, North Carolina /$fsponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards 210 1$aNew York :$cIEEE,$d2009. 215 $a1 online resource (viii, 146 pages) 311 $a0-7908-0124-8 606 $aGallium arsenide semiconductors$vCongresses 606 $aSemiconductors$xReliability$vCongresses 615 0$aGallium arsenide semiconductors 615 0$aSemiconductors$xReliability 712 02$aJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards, 801 0$bWaSeSS 801 1$bWaSeSS 906 $aPROCEEDING 912 $a996201321603316 996 $a2009 ROCS Workshop$92533833 997 $aUNISA