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181   $ctxt
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183   $acr
200 10$aInternational Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2002
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-1561-4 
606   $aIntegrated circuits$xReliability$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xDesign and construction$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xComputer-aided design$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xQuality control$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xVery large scale integration
615  0$aIntegrated circuits$xDesign and construction$xVery large scale integration
615  0$aIntegrated circuits$xVery large scale integration$xComputer-aided design
615  0$aIntegrated circuits$xVery large scale integration$xQuality control$xTesting
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.39/5
712 02$aIEEE Computer Society Technical Committee on VLSI,
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906   $aPROCEEDING
912   $a996200682203316
996   $aInternational Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings$92359231
997   $aUNISA