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200 10$aProceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2235-1 
606   $aElectronic digital computers$xTesting$xCircuits$vCongresses
606   $aElectronic circuits$xTesting$vCongresses
606   $aFault-tolerant computing$vCongresses
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606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aElectronic digital computers$xTesting$xCircuits
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615  0$aFault-tolerant computing
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
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712 02$aIEEE Computer Society Test Technology Council (TTTC).
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996   $aProceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan$92297370
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