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101 0 $aeng
181   $ctxt
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183   $acr
200 10$a1999 Annual Reliability and Maintainability Symposium
210 31$a[Place of publication not identified]$cI E E E$d1999
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-5143-6 
712 02$aIEEE, Institute of Electrical and Electronics Engineers, Inc. Staff
801  0$bPQKB
906   $aPROCEEDING
912   $a996199631903316
996   $a1999 Annual Reliability and Maintainability Symposium$92497575
997   $aUNISA