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200 10$aThird International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1994
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-6595-5 
606   $aElectronic circuits$xCosts$xCongresses
606   $aElectronic circuit design$xDecision making$xCongresses
606   $aElectronic circuits$xTesting$xCosts$xCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aElectronic circuits$xCosts$xCongresses
615  0$aElectronic circuit design$xDecision making$xCongresses
615  0$aElectronic circuits$xTesting$xCosts$xCongresses
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
702   $aAmbler$b Tony
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712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aInternational Conference on the Economics of Design, Test, and Manufacturing
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996   $aThird International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas$92524678
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