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181   $ctxt
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183   $acr
200 10$aVLSI Test Symposium, 1995 IEEE
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1995
215   $a1 online resource (520 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-7000-2 
606   $aIntegrated circuits$vCongresses
606   $aIntegrated circuits$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xTesting$vCongresses
615  0$aIntegrated circuits
615  0$aIntegrated circuits$xVery large scale integration
615  0$aIntegrated circuits$xVery large scale integration$xTesting
676   $a621
801  0$bPQKB
906   $aBOOK
912   $a996198216603316
996   $aVLSI Test Symposium, 1995 IEEE$92337299
997   $aUNISA