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181   $ctxt$2rdacontent
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200 10$a7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California
210 31$a[Place of publication not identified] :$cIEEE Computer Society,$d2006.
225 0 $aACM Conferences.
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7695-2523-7 
517 3 $aISQED '06
606   $aIntegrated circuits$xReliability$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xVery large scale integration$xDesign and construction$vCongresses
606   $aIntegrated circuits$xComputer-aided design$xVery large scale integration$vCongresses
606   $aIntegrated circuits$xTesting$xQuality control$xVery large scale integration$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xReliability$xVery large scale integration
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615  0$aIntegrated circuits$xComputer-aided design$xVery large scale integration
615  0$aIntegrated circuits$xTesting$xQuality control$xVery large scale integration
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
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712 02$aComponents, Packaging & Manufacturing Technology Society
712 02$aIEEE Circuits and Systems Society
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996   $a7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California$91924931
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