LEADER 01622oam 2200445zu 450 001 996197572703316 005 20210806235906.0 010 $a1-5090-9624-8 035 $a(CKB)1000000000278103 035 $a(SSID)ssj0000396672 035 $a(PQKBManifestationID)12119941 035 $a(PQKBTitleCode)TC0000396672 035 $a(PQKBWorkID)10335716 035 $a(PQKB)11451145 035 $a(EXLCZ)991000000000278103 100 $a20160829d2006 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aEleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom 210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d2006 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7695-2566-0 606 $aIntegrated circuits$xTesting$vCongresses 606 $aElectrical Engineering$2HILCC 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aIntegrated circuits$xTesting 615 7$aElectrical Engineering 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 676 $a621.3815/48 712 02$aIEEE Computer Society Technical Council on Test Technology. 712 12$aIEEE European Test Symposium 801 0$bPQKB 906 $aPROCEEDING 912 $a996197572703316 996 $aEleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, Southampton, United Kingdom$92351969 997 $aUNISA