LEADER 01516nam--2200409---450- 001 990002972340203316 005 20070913132250.0 010 $a3-540-37236-9 035 $a000297234 035 $aUSA01000297234 035 $a(ALEPH)000297234USA01 035 $a000297234 100 $a20070913d2006----km-y0itay0103----ba 101 $aeng 102 $aDE 105 $a||||||||001yy 200 1 $aStructural, Syntactic, and Statistical pattern recognition$eJoint IAPR International workshops SSPR 2006 and SPR 2006$fDit-Yan Yeung$eHong Kong, CHina, August 17-19, 2006$eproceedings 210 $aBerlin$cSpringer$dcopyr. 2006 215 $aXXI, 939 p.$cill.$d20 cm 225 2 $aLecture notes in computer science$v4109 410 0$12001$aLecture notes in computer science$v4109 454 1$12001 461 1$1001-------$12001 606 $aOttica $xSimulazione$yHong Kong$z2006$xImpiego degli elaboratori elettronici$xCongressi 676 $a006.424 702 $aYEUNG,$bDit-Yan 710 $aJoint IAPR International workshops SSPR 2006 and SPR 2006$eHong Kong>$f<2006 ;$0598253 801 0$aIT$bCBS$gISBD 912 $a990002972340203316 951 $a001 LNCS 4109$b34044/CBS$c001$d00215648 959 $aBK 969 $aSCI 979 $aSENATORE$b90$c20070913$lUSA01$h1321 979 $aSENATORE$b90$c20070913$lUSA01$h1322 979 $aSENATORE$b90$c20070913$lUSA01$h1322 996 $aStructural, Syntactic, and Statistical pattern recognition$91027676 997 $aUNISA