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200 1 $aDigital integrated circuit testing from a quality perspective$fEugene R. Hnatek
210   $aNew York$cVan Nostrand Reinhold$dcopyr. 1993
215   $aX, 179 p.$d24 cm.
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700  1$aHNATEK,$bEugene R.$025686
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996   $aDigital integrated circuit testing from a quality perspective$9986367
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