LEADER 01152nam--2200373---450-
001 990001199830203316
005 20040121163206.0
010   $a0-471-24139-3
035   $a000119983
035   $aUSA01000119983
035   $a(ALEPH)000119983USA01
035   $a000119983
100   $a20031016d1998----km-y0enga50------ba
101 0 $aeng
102   $aUS
105   $ay|||z|||001yy
200 1 $aSemiconductor material and device characterization$fDieter K. Schroder
205   $a2. ed.
210   $aNew York [etc.]$cA Wiley Interscience Publication$dcopyr. 1998
215   $aXXIV, 760 p.$cill.$d24 cm
606 0 $aSemiconduttori
676   $a621.38152
700  1$aSCHRODER,$bDieter K.$0324644
801  0$aIT$bsalbc$gISBD
912   $a990001199830203316
951   $a621.38152 SCH (A)$b17696 Ing.$c621$d00089355
959   $aBK
969   $aTEC
979   $aMARIA$b10$c20031016$lUSA01$h1313
979   $aPAOLA$b90$c20040121$lUSA01$h1626
979   $aPAOLA$b90$c20040121$lUSA01$h1632
979   $aPATRY$b90$c20040406$lUSA01$h1726
996   $aSemiconductor material and device characterization$9767613
997   $aUNISA