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181   $ctxt$2rdacontent
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200 14$aThe effect of experimental variables on industrial X-ray micro-computed sensitivity /$fDonald J. Roth, Richard W. Rauser
210  1$aCleveland, Ohio :$cNational Aeronautics and Space Administration, Glenn Research Center,$dDecember 2014.
215   $a1 online resource (37 pages) $ccolor illustrations
225 1 $aNASA/TM ;$v2014-218332
300   $aTitle from title screen (viewed on May 15, 2015).
300   $a"December 2014."
320   $aIncludes bibliographical references (page 37).
606   $aRadiography$2nasat
606   $aComputer aided tomography$2nasat
606   $aX ray analysis$2nasat
606   $aSignal to noise ratios$2nasat
606   $aModulation transfer function$2nasat
615  7$aRadiography.
615  7$aComputer aided tomography.
615  7$aX ray analysis.
615  7$aSignal to noise ratios.
615  7$aModulation transfer function.
700   $aRoth$b Don J.$01387267
702   $aRauser$b Richard W.
712 02$aNASA Glenn Research Center,
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