LEADER 01355nam2-2200421---450- 001 990000769290203316 005 20050510162817.0 010 $a88-311-4915-6 035 $a0076929 035 $aUSA010076929 035 $a(ALEPH)000076929USA01 035 $a0076929 100 $a20011123d1993----km-y0itay0103----ba 101 $aita 102 $aIT 105 $a||||||||001yy 200 1 $aIsrael Baal Shem Tov, Dov Bär di Meseritz$fa cura di Daniela Leoni$v1 210 $aRoma$cCittà nuova$d1993 215 $a362 p$d21 cm 225 2 $aTradizione d'Israele$v8$iBiblioteca chassidica$v2 410 $12001$aTradizione d'Israele$v8$iBiblioteca chassidica$a2 461 1$10010076926$12001$aI maestri del chassidismo$einsegnamento, vita, leggenda 606 0 $aHasidismo 676 $a296.8332 702 1$aLEONI,$bDaniela 801 0$aIT$bsalbc$gISBD 912 $a990000769290203316 951 $aII 2 1495(XIV 567 1)$b127212 L.M.$cXIV 959 $aBK 969 $aUMA 979 $aPATTY$b90$c20011123$lUSA01$h1701 979 $aPATTY$b90$c20011123$lUSA01$h1706 979 $aPATTY$b90$c20020325$lUSA01$h1727 979 $c20020403$lUSA01$h1724 979 $aPATRY$b90$c20040406$lUSA01$h1653 979 $aCOPAT7$b90$c20050510$lUSA01$h1628 996 $aIsrael Baal Shem Tov, Dov Bär di Meseritz$9964216 997 $aUNISA LEADER 03978nam 22006015 450 001 9910983484303321 005 20250806173610.0 010 $a9789819725113 024 7 $a10.1007/978-981-97-2511-3 035 $a(CKB)37312840200041 035 $a(MiAaPQ)EBC31885443 035 $a(Au-PeEL)EBL31885443 035 $a(DE-He213)978-981-97-2511-3 035 $a(EXLCZ)9937312840200041 100 $a20250121d2025 u| 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aMeasure and Integration $eAn Introduction /$fby Satya N. Mukhopadhyay, Subhasis Ray 205 $a1st ed. 2025. 210 1$aSingapore :$cSpringer Nature Singapore :$cImprint: Springer,$d2025. 215 $a1 online resource (647 pages) 225 1 $aUniversity Texts in the Mathematical Sciences,$x2731-9326 311 08$a9789819725106 327 $aPreliminaries -- Lebesgue Measure on Real Line -- Measurable Functions -- More about Sets and Functions -- The Lebesgue Integral -- Differentiation of Functions -- Lebesgue measure and integration in RN -- General Measure and Outer Measure -- Function Spaces -- Signed Measure and Complex Measure. 330 $aDesigned for senior undergraduate and graduate students in mathematics, this textbook offers a comprehensive exploration of measure theory and integration. It acts as a pivotal link bridging the Riemann integral and the Lebesgue integral, with a primary focus on tracing the evolution of measure and integration from their historical roots. A distinctive feature of the book is meticulous guidance, providing a step-by-step journey through the subject matter, thus rendering complex concepts more accessible to beginners. A fundamental grasp of differential and integral calculus, as well as Riemann integration, is recommended to ensure a smoother comprehension of the material. This textbook comprises 10 well-structured chapters, each thoughtfully organized to lead students from fundamental principles to advanced complexities. Beginning with the establishment of Lebesgue?s measure on the real line and an introduction to measurable functions, the book then delves into exploring the cardinalities of various set classes. As readers progress, the subtleties of the Lebesgue integral emerge, showcasing its generalization of the Riemann integral and its unique characteristics in higher dimensions. One of the book?s distinctive aspects is its indepth comparison of the Lebesgue integral, improper Riemann integral, and Newton integral, shedding light on their distinct qualities and relative independence. Subsequent chapters delve into the realm of general measures, Lebesgue-Stieltje's measure, Hausdorff ?s measure, and the concept of measure and integration in product spaces. Furthermore, the book delves into function spaces, such as ???????? spaces, and navigates the intricacies of signed and complex measures, providing students with a comprehensive foundation in this vital area of mathematics. 410 0$aUniversity Texts in the Mathematical Sciences,$x2731-9326 606 $aMeasure theory 606 $aAssociative rings 606 $aAssociative algebras 606 $aFunctions of real variables 606 $aMeasure and Integration 606 $aAssociative Rings and Algebras 606 $aReal Functions 615 0$aMeasure theory. 615 0$aAssociative rings. 615 0$aAssociative algebras. 615 0$aFunctions of real variables. 615 14$aMeasure and Integration. 615 24$aAssociative Rings and Algebras. 615 24$aReal Functions. 676 $a515.42 700 $aMukhopadhyay$b Satya N$0516085 701 $aRay$b Subhasis$01265599 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910983484303321 996 $aMeasure and Integration$94316917 997 $aUNINA LEADER 04597nam 22005175 450 001 9910254982603321 005 20251116155600.0 010 $a94-017-7512-5 024 7 $a10.1007/978-94-017-7512-0 035 $a(CKB)3710000000718383 035 $a(EBL)4533454 035 $a(DE-He213)978-94-017-7512-0 035 $a(MiAaPQ)EBC4533454 035 $a(PPN)194075346 035 $a(EXLCZ)993710000000718383 100 $a20160526d2016 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a3D Flash Memories /$fedited by Rino Micheloni 205 $a1st ed. 2016. 210 1$aDordrecht :$cSpringer Netherlands :$cImprint: Springer,$d2016. 215 $a1 online resource (391 p.) 300 $aDescription based upon print version of record. 311 08$a94-017-7510-9 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aDedication Page -- Foreword -- Preface -- Introduction -- About the Editor -- Acknowledgements -- 1 The Business of NAND -- 2 Reliability of 3D NAND Flash memories -- 3 3D Stacked NAND Flash memories -- 4 3D Charge Trap NAND Flash memories -- 5 3D Floating Gate NAND Flash memories -- 6 Advanced Architectures for 3D NAND Flash memories with vertical channel -- 7 3D VG-Type NAND Flash memories -- 8 RRAM Cross-point arrays -- 9 3D Multi-Chip Integration and Packaging Technology -- 10 BCH and LDPC Error Correction Codes for NAND Flash memories -- 11 Advanced algebraic and graph-based ECC schemes for modern NVMs -- 12 System-Level Considerations on Design of 3D NAND Flash memories -- Index. 330 $aThis book walks the reader through the next step in the evolution of NAND flash memory technology, namely the development of 3D flash memories, in which multiple layers of memory cells are grown within the same piece of silicon. It describes their working principles, device architectures, fabrication techniques and practical implementations, and highlights why 3D flash is a brand new technology. After reviewing market trends for both NAND and solid state drives (SSDs), the book digs into the details of the flash memory cell itself, covering both floating gate and emerging charge trap technologies. There is a plethora of different materials and vertical integration schemes out there. New memory cells, new materials, new architectures (3D Stacked, BiCS and P-BiCS, 3D FG, 3D VG, 3D advanced architectures); basically, each NAND manufacturer has its own solution. Chapter 3 to chapter 7 offer a broad overview of how 3D can materialize. The 3D wave is impacting emerging memories as well and chapter 8 covers 3D RRAM (resistive RAM) crosspoint arrays. Visualizing 3D structures can be a challenge for the human brain: this is way all these chapters contain a lot of bird?s-eye views and cross sections along the 3 axes. The second part of the book is devoted to other important aspects, such as advanced packaging technology (i.e. TSV in chapter 9) and error correction codes, which have been leveraged to improve flash reliability for decades. Chapter 10 describes the evolution from legacy BCH to the most recent LDPC codes, while chapter 11 deals with some of the most recent advancements in the ECC field. Last but not least, chapter 12 looks at 3D flash memories from a system perspective. Is 14nm the last step for planar cells? Can 100 layers be integrated within the same piece of silicon? Is 4 bit/cell possible with 3D? Will 3D be reliable enough for enterprise and datacenter applications? These are some of the questions that this book helps answering by providing insights into 3D flash memory design, process technology and applications. 606 $aComputer storage devices 606 $aElectronic circuits 606 $aMemory Structures$3https://scigraph.springernature.com/ontologies/product-market-codes/I12034 606 $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 615 0$aComputer storage devices. 615 0$aElectronic circuits. 615 14$aMemory Structures. 615 24$aElectronic Circuits and Devices. 615 24$aCircuits and Systems. 676 $a004 702 $aMicheloni$b Rino$4edt$4http://id.loc.gov/vocabulary/relators/edt 906 $aBOOK 912 $a9910254982603321 996 $a3D Flash Memories$92288981 997 $aUNINA