LEADER 00685nam0-22002531i-450- 001 990001129880403321 035 $a000112988 035 $aFED01000112988 035 $a(Aleph)000112988FED01 035 $a000112988 100 $a20000920d1928----km-y0itay50------ba 101 0 $aeng 200 1 $a<>géometrie non Euclidéenne$fde Barbarin 210 $aParis$cGauthier-Villars$d1928 300 $aDonazione Caccioppoli 700 1$aBarbarin,$bPaul$054281 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990001129880403321 952 $a109-G-20$b4323$fMA1 959 $aMA1 996 $aGéometrie non Euclidéenne$9344845 997 $aUNINA DB $aING01 LEADER 01124nam0-2200361li-450 001 990000172080203316 005 20180312154815.0 010 $a0-918334-67-5 035 $a0017208 035 $aUSA010017208 035 $a(ALEPH)000017208USA01 035 $a0017208 100 $a20001109d1992----km-y0itay0103----ba 101 0 $aeng 102 $aUS 200 1 $aSediment transport technology$ewater and sediment dynamics$esolutions manual$fby Fuat Senturk and Daryl B. Simons 210 $aLittleton (Co)$cWater Resources Publications$dcopyr. 1992 300 $aa fogli mobili 610 1 $asedimenti tecnologia manuali 676 $a551.304$9. 700 1$aSenturk,$bFuat$0440570 702 1$aSimons,$bDaryl B. 801 $aSistema bibliotecario di Ateneo dell' Università di Salerno$gRICA 912 $a990000172080203316 951 $a551.304 SEN$b0005595 959 $aBK 969 $aTEC 979 $c19950217 979 $c20001110$lUSA01$h1712 979 $c20020403$lUSA01$h1625 979 $aPATRY$b90$c20040406$lUSA01$h1612 996 $aSediment transport technology$91501645 997 $aUNISA LEADER 01659nam 2200505 450 001 9910467842403321 005 20200520144314.0 010 $a1-119-37043-4 010 $a1-119-37044-2 035 $a(MiAaPQ)EBC5057719 035 $a(Au-PeEL)EBL5057719 035 $a(CaPaEBR)ebr11445944 035 $a(CaONFJC)MIL1038211 035 $a(OCoLC)1004847461 035 $a(EXLCZ)994340000000204649 100 $a20171020h20172017 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aEssentials of WISC-V integrated assessment /$fSusan Engi Raiford 210 1$aHoboken, New Jersey :$cWiley,$d2017. 210 4$d©2017 215 $a1 online resource (337 pages) $cillustrations, tables 225 1 $aEssentials of Psychological Assessment Series 311 $a1-119-37042-6 320 $aIncludes bibliographical references at the end of each chapters and index. 410 0$aEssentials of psychological assessment series. 606 $aWechsler Preschool and Primary Scale of Intelligence 606 $aChildren$xIntelligence testing 606 $aChild development$xTesting 608 $aElectronic books. 615 0$aWechsler Preschool and Primary Scale of Intelligence. 615 0$aChildren$xIntelligence testing. 615 0$aChild development$xTesting. 676 $a155.4/1393 700 $aRaiford$b Susan Engi$0877260 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910467842403321 996 $aEssentials of WISC-V integrated assessment$91960724 997 $aUNINA LEADER 05431nam 22007451 450 001 9910818082403321 005 20240401173944.0 010 $a9783527655083 010 $a3527655085 010 $a9783527655069 010 $a3527655069 010 $a9783527655090 010 $a3527655093 035 $a(CKB)2550000001117149 035 $a(EBL)1388818 035 $a(OCoLC)858655510 035 $a(SSID)ssj0001164473 035 $a(PQKBManifestationID)11635401 035 $a(PQKBTitleCode)TC0001164473 035 $a(PQKBWorkID)11181089 035 $a(PQKB)10943451 035 $a(MiAaPQ)EBC1388818 035 $a(Au-PeEL)EBL1388818 035 $a(CaPaEBR)ebr10762543 035 $a(CaONFJC)MIL517587 035 $a(Perlego)1014750 035 $a(EXLCZ)992550000001117149 100 $a20131006d2013 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aNanobeam x-ray scattering $eprobing matter at the nanoscale /$fJulian Stangl [and three others] 205 $a1st ed. 210 1$aHoboken, New Jersey :$cJohn Wiley & sons,$d2013. 215 $a1 online resource (284 p.) 300 $aDescription based upon print version of record. 311 08$a9783527410774 311 08$a3527410775 311 08$a9781299863361 311 08$a1299863361 320 $aIncludes bibliographical references and index. 327 $aNanobeam X-Ray Scattering; Contents; Foreword; Preface; 1 Introduction; 1.1 X-ray Interaction with Matter; 1.1.1 Transmission of X-ray; 1.1.2 Diffraction of X-rays; 1.1.3 X-ray Elemental Sensitivity; 1.2 Diffraction at Different Length scales and Real-Space Resolution; 1.2.1 How to Produce an X-ray Nanobeam; 1.2.2 Experiments with Nanobeams; 1.2.3 Coherence Properties of Small Beams; 1.2.4 Side Issues ?; 1.3 Future Developments; 2 X-ray Diffraction Principles; 2.1 A Brief Introduction to Diffraction Theory; 2.1.1 Interference of X-ray Waves; 2.2 Kinematic X-ray Diffraction Theory 327 $a2.2.1 The Structure Factor 2.2.2 The Form Factor; 2.2.3 Reciprocal Lattice of Nanostructures; 2.2.4 The Phase Problem; 2.3 Reflectivity; 2.4 Properties of X-ray Beams; 2.5 A Note on Coherence; 2.5.1 Longitudinal Coherence and Wavelength Distribution; 2.5.2 Longitudinal Coherence Length; 2.5.3 Transverse Coherence and Thermal Sources; 2.5.4 Transverse Coherence Length; 2.6 X-ray Sources; 2.7 Diffraction Measurement: How to Access q in a Real Experiment; 2.7.1 Diffraction Geometries; 2.7.2 Length scales; 3 X-ray Focusing Elements Characterization; 3.1 Introduction and Context 327 $a3.2 Refractive X-ray Lenses 3.2.1 Characterization of Focusing Elements; 3.2.2 Spherical Refractive X-ray Lenses; 3.2.3 Parabolic Compound Refractive Lenses (CRL); 3.2.4 Kinoform Lenses; 3.2.5 Characteristics of the Refractive Lenses; 3.3 X-ray Mirrors. Reflection of X-rays at Surfaces; 3.3.1 Reflective X-ray Optics (Kirkpatrick-Baez Mirrors); 3.3.2 Capillaries; 3.3.3 Waveguides (Resonators); 3.3.4 Other Reflective Optical Elements; 3.4 Diffraction X-ray Optics; 3.4.1 Fresnel Zone Plates; 3.4.2 Hologram of a Point Object; 3.4.3 Quantities Characterizing a Binary Zone Plate 327 $a3.4.4 Multilevel Zone Plate 3.4.5 Getting a Clean and Intense Focused Beam with ZPs; 3.4.6 Bragg-Fresnel Lenses; 3.4.7 Multilayer Laue Lenses; 3.4.8 Photon Sieves; 3.4.9 Beam Compressors; 3.5 Other X-ray Optics; 3.6 Measuring the Size of the X-ray Focused Spot; 3.7 Conclusion; 4 Scattering Experiments Using Nanobeams; 4.1 From the Ensemble Average Approach towards the Single Nanostructure Study; 4.1.1 A Motivation for the Use of Small X-ray Beams; 4.1.2 Required Focused Beam Properties; 4.2 Scanning X-ray Diffraction Microscopy; 4.3 Finite Element Based Analysis of Diffraction Data 327 $a4.4 Single Structure Inside a Device 4.5 Examples from Biology; 4.6 Recent Experiments: The Current Limits; 4.6.1 Strain Distribution in Nanoscale Ridges; 4.6.2 Between Single Structure and Ensemble Average; 4.7 Outlook; 4.7.1 Experimental Developments; 5 Nanobeam Diffraction Setups; 5.1 Introduction; 5.2 Typical X-ray Diffraction Setup; 5.3 Nanodiffraction Setup Requirements; 5.3.1 Diffractometer; 5.3.2 Restriction of Setup; 5.3.3 Stability: How to Keep the Beam on the Sample; 5.3.4 Beating Drifts: More Solutions; 5.4 Nanobeam and Coherence Setup 327 $a5.5 Detectors: Pixel and Time Resolution, Dynamical Range 330 $aA comprehensive overview of the possibilities and potential of X-ray scattering using nanofocused beams for probing matter at the nanoscale, including guidance on the design of nanobeam experiments. 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