LEADER 01307nam2-2200385li-450 001 990000109110203316 005 20180312154733.0 010 $a0-8247-7668-2 035 $a0010911 035 $aUSA010010911 035 $a(ALEPH)000010911USA01 035 $a0010911 100 $a20001109d1987----km-y0itay0103----ba 101 0 $aeng 102 $aUS 200 1 $aIntegrated circuit quality and reliability$fEugene R. Hnatek 210 $aNew York [etc.]$cMarcell Dekker$dcopyr. 1987 215 $aXIII, 698 p.$cill.$d23 cm 225 2 $aElectrical engineering and electronics$v41 410 0$10010010912$12001$aElectrical engineering and electronics$ea series of reference books and textbooks$fMarlin O. Thurston, William Middendorf, editors 610 1 $aaffidabilita' (ingegneria) 610 1 $acircuiti integrati 676 $a621381$9. 700 1$aHnatek,$bEugene R.$025686 801 $aSistema bibliotecario di Ateneo dell' Università di Salerno$gRICA 912 $a990000109110203316 951 $a621.381 HNA$b0001023 959 $aBK 969 $aTEC 979 $c19910620 979 $c20001110$lUSA01$h1711 979 $c20020403$lUSA01$h1618 979 $aPATRY$b90$c20040406$lUSA01$h1608 996 $aIntegrated circuit quality and reliability$91491784 997 $aUNISA