LEADER 01590nam0-2200517---450-
001 990000065630203316
005 20000522
010   $a0-471-98502-3
035   $a0006563
035   $aUSA010006563
035   $a(ALEPH)000006563USA01
035   $a0006563
100   $a20000522d1999----|||y0itay0103----ba
101 0 $aEng
102   $aUS
105   $a||||||||001yy
200 1 $aMicrostructural characterization of materials$fDavid Brandon and Wayne D. Kaplan
210   $aChichester$cJohn Wiley & sons$d1999
215   $aXIII, 409 p.$d23 cm.
606 0 $aMateriali$xProprietá
606 0 $aMicrostruttura
676   $a620.11299
700  1$aBRANDON,$bDavid$0747018
701  1$aKAPLAN,$bWayne D.$0747019
801   $aIT$bSALBC$gISBD
912   $a990000065630203316
951   $a620.11299 BRA$b13597 ING$c620.11299$d00001084
951   $a620.11299 BRA$b13345 ING$c620.11299 BRA
959   $aBK
969   $aTEC
979   $c20000914$lUSA01$h1730
979   $c20001019$lUSA01$h1055
979   $c20001019$lUSA01$h1453
979   $c20001019$lUSA01$h1500
979   $c20001019$lUSA01$h1538
979   $c20001024$lUSA01$h1514
979   $c20001027$lUSA01$h1518
979   $c20001027$lUSA01$h1522
979   $c20001110$lUSA01$h1709
979   $c20001124$lUSA01$h1207
979   $aPATTY$b90$c20010515$lUSA01$h1252
979   $aPATTY$b90$c20010515$lUSA01$h1255
979   $c20020403$lUSA01$h1614
979   $aPATRY$b90$c20040406$lUSA01$h1606
996   $aMicrostructural characterization of materials$91491774
997   $aUNISA