LEADER 01144nam0 2200325 450 001 000027075 005 20100301100846.0 010 $a978-88-324-6547-1 100 $a20100218d2009----km-y0itay50------ba 101 0 $aita 102 $aIT 105 $ay-------001yy 200 1 $aCodice penale$eannotato con la giurisprudenza$fRenato Bricchetti, Alberto Cadoppi, Paolo Veneziani 210 $aMilano$cIl Sole 24 ore$dc2009 215 $aXXVI, 3650 p.$d24 cm 225 2 $a<>codici di Guida al diritto$iI commentati 410 0$12001$a<>codici di Guida al diritto. I commentati 500 10$aCodice penale : annotato con la giurisprudenza$942245 610 1 $aCodice penale 610 1 $aDiritto penale 676 $a3454.45002632$v21$9Diritto penale. Italia. Leggi singole e raccolte 702 1$aBricchetti,$bRenato 702 1$aCadoppi,$bAlberto 702 1$aVeneziani,$bPaolo 710 02$aItalia$0423419 801 0$aIT$bUNIPARTHENOPE$c20100218$gRICA$2UNIMARC 912 $a000027075 951 $a348-C/114$b42063$cNAVA1$d2010 996 $aCodice penale : annotato con la giurisprudenza$942245 997 $aUNIPARTHENOPE LEADER 02810nam 2200625Ia 450 001 9910451259803321 005 20200520144314.0 010 $a1-280-53489-3 010 $a9786610534890 010 $a0-19-535846-5 035 $a(CKB)1000000000405107 035 $a(EBL)430981 035 $a(OCoLC)435816746 035 $a(SSID)ssj0000205322 035 $a(PQKBManifestationID)11171163 035 $a(PQKBTitleCode)TC0000205322 035 $a(PQKBWorkID)10191880 035 $a(PQKB)10633086 035 $a(MiAaPQ)EBC430981 035 $a(Au-PeEL)EBL430981 035 $a(CaPaEBR)ebr10358552 035 $a(CaONFJC)MIL53489 035 $a(EXLCZ)991000000000405107 100 $a19940915d1995 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aMonte Carlo modeling for electron microscopy and microanalysis$b[electronic resource] /$fDavid C. Joy 210 $aNew York $cOxford University Press$d1995 215 $a1 online resource (225 p.) 225 1 $aOxford series in optical and imaging sciences ;$v9 300 $aDescription based upon print version of record. 311 $a0-19-508874-3 320 $aIncludes bibliographical references. 327 $aContents; 1. An Introduction to Monte Carlo Methods; 2. Constructing a Simulation; 3. The Single Scattering Model; 4. The Plural Scattering Model; 5. The Practical Application of Monte Carlo Models; 6. Backscattered Electrons; 7. Charge Collection Microscopy and Cathodoluminescence; 8. Secondary Electrons and Imaging; 9. X-ray Production and Microanalysis; 10. What Next in Monte Carlo Simulations?; References; Index 330 $a1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations? 410 0$aOxford series in optical and imaging sciences ;$v9. 606 $aElectron microscopy$xComputer simulation 606 $aElectron probe microanalysis$xComputer simulation 606 $aMonte Carlo method 608 $aElectronic books. 615 0$aElectron microscopy$xComputer simulation. 615 0$aElectron probe microanalysis$xComputer simulation. 615 0$aMonte Carlo method. 676 $a502/.8/25 700 $aJoy$b David C.$f1943-$0986272 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910451259803321 996 $aMonte Carlo modeling for electron microscopy and microanalysis$92254186 997 $aUNINA