LEADER 01619nam 2200445 450 001 996204935103316 005 20230421041059.0 035 $a(CKB)111026746743038 035 $a(SSID)ssj0000558907 035 $a(PQKBManifestationID)12197551 035 $a(PQKBTitleCode)TC0000558907 035 $a(PQKBWorkID)10565291 035 $a(PQKB)11399688 035 $a(WaSeSS)IndRDA00124075 035 $a(EXLCZ)99111026746743038 100 $a20200602d1996 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aATS '96 $eproceedings of the Fifth Asian Test Symposium : November 20-22, 1996, Hsinchu, Taiwan /$fsponsored by the IEEE Computer Society Technical Committee on Test Technology -- Asia Subcommittee, National Tsing Hua University 210 1$aLos Alamitos, California :$cIEEE Computer Society,$d1996. 215 $a1 online resource (154 pages) 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-8186-7478-4 606 $aElectronic digital computers$xCircuits$xTesting$vCongresses 606 $aElectronic circuits$xTesting$vCongresses 606 $aFault-tolerant computing$vCongresses 615 0$aElectronic digital computers$xCircuits$xTesting 615 0$aElectronic circuits$xTesting 615 0$aFault-tolerant computing 676 $a62 712 02$aIEEE Computer Society.$bTest Technology Technical Committee.$bAsia Subcommittee, 801 0$bWaSeSS 801 1$bWaSeSS 906 $aBOOK 912 $a996204935103316 996 $aATS '96$92338175 997 $aUNISA LEADER 00998nam0 22002771i 450 001 UON00279262 005 20231205103829.923 100 $a20060629d1975 |0itac50 ba 101 $afre 102 $aFR 105 $a|||| 1|||| 200 1 $aActes du Protaton$fDenise Papachryssanthou 205 $aParis : Lethielleux$b1975 210 $a2 v.$a28 cm 215 $aComprende un volume di tavole 410 1$1001UON00279247$12001 $aArchives de l'Athos$v7 606 $aMONASTERI GRECI$3UONC049410$2FI 620 $aFR$dParis$3UONL002984 700 1$aPAPACHRYSANTHOU$bDenise$3UONV161713$0692419 712 $aLethielleux$3UONV256560$4650 801 $aIT$bSOL$c20240220$gRICA 899 $aSIBA - SISTEMA BIBLIOTECARIO DI ATENEO$2UONSI 912 $aUON00279262 950 $aSIBA - SISTEMA BIBLIOTECARIO DI ATENEO$dSI GRECO E 0823 $eSI EO 1716 5 0823 996 $aActes du Protaton$91245920 997 $aUNIOR