LEADER 03721nam 22007455 450 001 9911022454803321 005 20250831130216.0 010 $a981-9664-18-7 024 7 $a10.1007/978-981-96-6418-4 035 $a(CKB)40851803700041 035 $a(MiAaPQ)EBC32276253 035 $a(Au-PeEL)EBL32276253 035 $a(DE-He213)978-981-96-6418-4 035 $a(OCoLC)1544965495 035 $a(EXLCZ)9940851803700041 100 $a20250831d2025 u| 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aAdvances in Metrology $eSelect Proceedings of AdMet 2024 /$fedited by Sanjay Yadav, Naveen Garg, Mukesh Kumar, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Manoj Kumar 205 $a1st ed. 2025. 210 1$aSingapore :$cSpringer Nature Singapore :$cImprint: Springer,$d2025. 215 $a1 online resource (338 pages) 225 1 $aLecture Notes in Mechanical Engineering,$x2195-4364 311 08$a981-9664-17-9 327 $aProgress towards the measurement of low differential pressure by using twin-piston pressure balance in hydraulic mode -- Analysis of Source and Source Region of Coarse Mode Aerosol (PM10) in Varanasi, India -- A review on microplastics in indoor environments: Techniques for measurement and environmental implications -- Evaluating the Stratum 1 NTP Server Performance at CSIR ? NPL for Nation-Wide Time Synchronization -- Data acquisition and remote monitoring of critical parameters of Primary Frequency Standard. 330 $aThis book presents the select proceedings of the 9th National Conference on Advances in Metrology (AdMet 2024). It highlights and discusses the recent technological advancements and developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, and digital metrology, gas and aerosol metrology among others. This book is aimed at those engaged in conformity assessment, quality system management, calibration, and testing in all sectors of industry as well as in academic research. The book is a valuable reference for metrologists, scientists, engineers, academicians, and students from research institutes and industrial establishments to explore future directions and research in the areas of sensors, advanced materials, measurements, and quality improvement. 410 0$aLecture Notes in Mechanical Engineering,$x2195-4364 606 $aAtoms 606 $aMetrology 606 $aMeasurement 606 $aMeasuring instruments 606 $aOptical measurements 606 $aNanotechnology 606 $aMetrology and Fundamental Constants 606 $aMeasurement Science and Instrumentation 606 $aOptical Metrology 606 $aNanometrology 615 0$aAtoms. 615 0$aMetrology. 615 0$aMeasurement. 615 0$aMeasuring instruments. 615 0$aOptical measurements. 615 0$aNanotechnology. 615 14$aMetrology and Fundamental Constants. 615 24$aMeasurement Science and Instrumentation. 615 24$aOptical Metrology. 615 24$aNanometrology. 676 $a539 676 $a530.8 700 $aYadav$b Sanjay$01425656 701 $aGarg$b Naveen$01220495 701 $aMukesh Kumar$01880108 701 $aAggarwal$b Shankar G$01437320 701 $aJaiswal$b Shiv Kumar$01437321 701 $aKumar$b Manoj$0720895 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911022454803321 996 $aAdvances in Metrology$94531254 997 $aUNINA