LEADER 02732nam 2200661Ia 450 001 9911020380003321 005 20200520144314.0 010 $a9786611764258 010 $a9781281764256 010 $a1281764256 010 $a9783527613748 010 $a3527613749 010 $a9783527613755 010 $a3527613757 035 $a(CKB)1000000000377522 035 $a(EBL)482155 035 $a(OCoLC)261345508 035 $a(SSID)ssj0000275599 035 $a(PQKBManifestationID)11229914 035 $a(PQKBTitleCode)TC0000275599 035 $a(PQKBWorkID)10222806 035 $a(PQKB)11041685 035 $a(MiAaPQ)EBC482155 035 $a(Perlego)2789575 035 $a(EXLCZ)991000000000377522 100 $a19990502d1999 uys 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aX-ray characterization of materials /$fEric Lifshin (ed.) 210 $aWeinheim ;$aNew York $cWiley-VCH$d1999 215 $a1 online resource (280 p.) 300 $aDescription based upon print version of record. 311 08$a9783527296576 311 08$a3527296573 320 $aIncludes bibliographical references and index. 327 $aX-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; Index 330 $aLinking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composit 606 $aX-ray spectroscopy 606 $aMaterials$xAnalysis 606 $aSurfaces (Technology)$xAnalysis 606 $aX-rays$xIndustrial applications 615 0$aX-ray spectroscopy. 615 0$aMaterials$xAnalysis. 615 0$aSurfaces (Technology)$xAnalysis. 615 0$aX-rays$xIndustrial applications. 676 $a620.11272 676 $a778.33 701 $aLifshin$b Eric$01840300 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911020380003321 996 $aX-ray characterization of materials$94419846 997 $aUNINA