LEADER 02296oam  2200649zu 450 
001 9911020251203321
005 20230607215346.0
010   $a1-280-55472-X
010   $a9786610554720
010   $a0-470-85212-7
010   $a0-470-84605-4
035   $a(CKB)1000000000019116
035   $a(SSID)ssj0000080419
035   $a(PQKBManifestationID)11121087
035   $a(PQKBTitleCode)TC0000080419
035   $a(PQKBWorkID)10095742
035   $a(PQKB)11490218
035   $a(MiAaPQ)EBC4956469
035   $a(Au-PeEL)EBL4956469
035   $a(CaONFJC)MIL55472
035   $a(OCoLC)53468482
035   $a(EXLCZ)991000000000019116
100   $a20160829d2002      uy 
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt
182   $cc
183   $acr
200 10$aESD in silicon integrated circuits
205   $a2nd ed.
210 31$a[Place of publication not identified]$cJ Wiley$d2002
215   $a1 online resource (421 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-471-49871-8 
330   $aElectrostatic discharge (ESD) effects in silicon integrated circuits have become a major concern as high circuit density technologies shrink to sub-micron dimensions. This update of a classic reference provides a complete and current overview of ESD and its implications in the design and development of new semiconductor technologies and integrated circuits.
606   $aSemiconductors$xProtection
606   $aIntegrated circuits$xProtection
606   $aElectrostatics
606   $aStatic eliminators
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aSemiconductors$xProtection.
615  0$aIntegrated circuits$xProtection.
615  0$aElectrostatics.
615  0$aStatic eliminators.
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.3815/2
700   $aAmerasekera$b E. A$01841869
702   $aDuvvury$b Charvaka
801  0$bPQKB
906   $aBOOK
912   $a9911020251203321
996   $aESD in silicon integrated circuits$94421750
997   $aUNINA