LEADER 00853nam0-22003011--450- 001 990008542980403321 005 20071113083017.0 010 $a0415019117 035 $a000854298 035 $aFED01000854298 035 $a(Aleph)000854298FED01 035 $a000854298 100 $a20070727d1992----km-y0itay50------ba 101 0 $aeng 102 $aGB 105 $ay-------001yy 200 1 $a<>image of aristocracy in Britain, 1000-1300$fDavid Crouch 210 $aLondon [etc.]$cRoutledge$d1992 215 $aXIII, 392 p.$cill.$d23 cm 676 $a390.230941$v20$zita 700 1$aCrouch,$bDavid$f<1953- >$0270789 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990008542980403321 952 $aSDI-KD 591$b3143$fSDI 959 $aSDI 996 $aImage of aristocracy in Britain, 1000-1300$9709995 997 $aUNINA LEADER 05502nam 2200721 a 450 001 9911019978703321 005 20200520144314.0 010 $a9781118578469 010 $a1118578465 010 $a9781299186606 010 $a1299186602 010 $a9781118576670 010 $a1118576675 010 $a9781118578476 010 $a1118578473 035 $a(CKB)2670000000327633 035 $a(EBL)1120638 035 $a(SSID)ssj0000904778 035 $a(PQKBManifestationID)11494227 035 $a(PQKBTitleCode)TC0000904778 035 $a(PQKBWorkID)10921894 035 $a(PQKB)11139604 035 $a(MiAaPQ)EBC1120638 035 $a(OCoLC)826022286 035 $a(PPN)242787185 035 $a(Perlego)1012790 035 $a(EXLCZ)992670000000327633 100 $a20120807d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aFull-field measurements and identification in solid mechanics /$fedited by Michel Grediac, Francois Hild 210 $aHoboken, N.J. $cISTE Ltd./John Wiley and Sons Inc.$d2013 215 $a1 online resource (498 p.) 225 0 $aMechanical engineering and solid mechanics series 300 $aDescription based upon print version of record. 311 08$a9781848212947 311 08$a1848212941 320 $aIncludes bibliographical references and index. 327 $aTitle Page; Contents; Foreword; Introduction; Chapter 1. Basics of Metrology and Introduction to Techniques; 1.1. Introduction; 1.2. Terminology: international vocabulary of metrology; 1.2.1. Absolute or differential measurement; 1.2.2. Main concepts; 1.3. Spatial aspect; 1.3.1. Spatial frequency; 1.3.2. Spatial filtering; 1.4. Classification of optical measurement techniques; 1.4.1. White light measurement methods; 1.4.2. Interference methods; 1.4.3. Sensitivity vector; 1.4.4. Synthetic sensitivity vectors; 1.4.5. The different types of interferometric measurements 327 $a1.4.6. Holography, digital holography1.4.7. Conclusion; 1.5. Bibliography; Chapter 2. Photoelasticity; 2.1. Introduction; 2.2. Concept of light polarization; 2.3. Birefringence phenomenon; 2.4. The law of optico-mechanics; 2.5. Several types of polariscopes; 2.5.1. Plane polariscope; 2.5.2. Circular polariscope; 2.5.3. White light polariscope; 2.5.4. Photoelastic coating; 2.6. Measurement of photoelastic constant C; 2.7. Analysis by image processing; 2.7.1. Using a plane polariscope; 2.7.2. Using a circular polariscope; 2.7.3. Using color images 327 $a2.8. Post-processing of photoelastic parameters2.8.1. Drawing of isostatics or stress trajectories; 2.8.2. Particular points; 2.8.3. Stress separation and integration of the equilibrium equations; 2.8.4. Comparison between experimentation and numerical modeling; 2.9. Three-dimensional photoelasticity; 2.9.1. The method of stress freezing and mechanical slicing; 2.9.2. Optical slicing; 2.9.3. Application example; 2.10. Conclusion; 2.11. Bibliography; Chapter 3. Grid Method, Moire? and Deflectometry; 3.1. Introduction; 3.2. Principle; 3.3. Surface encoding; 3.4. Moire?; 3.5. Phase detection 327 $a3.5.1. Global extraction procedure3.5.2. Local phase detection: phase shifting; 3.5.3. Measuring both components of the displacement; 3.6. Sensitivity to out-of-plane displacements; 3.7. Grid defects; 3.8. Large deformation/large strain; 3.8.1. Explicit method; 3.8.2. Implicit method; 3.8.3. Large strain; 3.9. Fringe projection; 3.10. Deflectometry; 3.11. Examples; 3.11.1. Off-axis tensile test of a unidirectional composite coupon; 3.11.2. Rigid body displacement; 3.11.3. SEM measurement; 3.11.4. Characterization of lens distortion; 3.12. Conclusion; 3.13. Bibliography 327 $aChapter 4. Digital Holography Methods4.1. Introduction; 4.2. Basics of wave optics; 4.2.1. Light diffraction; 4.2.2. Interference; 4.3. Basics of digital holography; 4.3.1. Recording the hologram; 4.3.2. Numerical reconstruction with the discrete Fresnel transform; 4.3.3. Numerical reconstruction using convolution with adjustable magnification; 4.3.4. Sensitivity vector; 4.4. Basics of digital holographic interferometry; 4.4.1. Phase difference; 4.4.2. Spatial filtering of the phase and phase unwrapping; 4.5. Digital holographic interferometry with spatial multiplexing; 4.5.1. Principle 327 $a4.5.2. Theory 330 $a This timely book presents cutting-edge developments by experts in the field on the rapidly developing and scientifically challenging area of full-field measurement techniques used in solid mechanics - including photoelasticity, grid methods, deflectometry, holography, speckle interferometry and digital image correlation. The evaluation of strains and the use of the measurements in subsequent parameter identification techniques to determine material properties are also presented.Since parametric identification techniques require a close coupling of theoretical models and experimental m 410 0$aISTE 606 $aEngineering mathematics 606 $aMeasurement 615 0$aEngineering mathematics. 615 0$aMeasurement. 676 $a530.41 701 $aGrediac$b Michel$0520707 701 $aHild$b F$g(Francois)$0520708 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911019978703321 996 $aFull-Field measurements and identification in solid mechanics$9834548 997 $aUNINA