LEADER 03134nam 2200589 a 450 001 9911019099703321 005 20200520144314.0 010 $a9786611842550 010 $a9781281842558 010 $a1281842559 010 $a9783527614561 010 $a3527614567 010 $a9783527614554 010 $a3527614559 035 $a(CKB)1000000000377543 035 $a(EBL)481519 035 $a(SSID)ssj0000145149 035 $a(PQKBManifestationID)11163577 035 $a(PQKBTitleCode)TC0000145149 035 $a(PQKBWorkID)10156196 035 $a(PQKB)10409477 035 $a(MiAaPQ)EBC481519 035 $a(OCoLC)212132231 035 $a(Perlego)2758695 035 $a(EXLCZ)991000000000377543 100 $a20120114d1997 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aElectron microscopy $eprinciples and fundamentals /$fedited by S. Amelinckx ... [et al.] 210 $aWeinheim [Germany] $cVCH, a Wiley Co.$d1997 215 $a1 online resource (529 p.) 300 $aDescription based upon print version of record. 311 08$a9783527294794 311 08$a3527294791 320 $aIncludes bibliographical references and index. 327 $aElectron Microscopy Principles and Fundamentals; Contents; Introduction; 1 Stationary Beam Methods; 1.1 Transmission Electron Microscopy; 1.1.1 Diffraction Contrast Transmission Electron Microscopy; 1.1.2 High-Resolution Electron Microscopy; 1.2 Reflection Electron Microscopy; 1.3 Electron Energy-Loss Spectroscopy Imaging; 1.4 High Voltage Electron Microscopy; 1.5 Convergent Beam Electron Diffraction; 1.6 Low-Energy Electron Microscopy; 1.7 Lorentz Microscopy; 1.8 Electron Holography Methods; 1.9 Spin-Polarized Low-Energy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy 327 $a2.2 Scanning Transmission Electron Microscopy2.3 Scanning-Transmission Electron Microscopy : Z Contrast; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.5 Scanning Microanalysis; 2.6 Imaging Secondary Ion Mass Spectrometry; 2.7 Scanning Electron Microscopy with Polarization Analysis (SEMPA); Index 330 $aDerived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.Topics include:* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Met 606 $aElectron microscopy 615 0$aElectron microscopy. 676 $a502.825 701 $aAmelinckx$b S$050786 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911019099703321 996 $aElectron microscopy$94421306 997 $aUNINA