LEADER 05424nam 2200721Ia 450 001 9911018813403321 005 20200520144314.0 010 $a9786613905475 010 $a9781283593021 010 $a1283593025 010 $a9781118520864 010 $a1118520866 010 $a9781118521014 010 $a1118521013 010 $a9781118521045 010 $a1118521048 035 $a(CKB)2560000000092792 035 $a(EBL)1016652 035 $a(OCoLC)811504024 035 $a(SSID)ssj0000712007 035 $a(PQKBManifestationID)11444705 035 $a(PQKBTitleCode)TC0000712007 035 $a(PQKBWorkID)10722131 035 $a(PQKB)10721409 035 $a(MiAaPQ)EBC1016652 035 $a(Perlego)1007454 035 $a(EXLCZ)992560000000092792 100 $a19980730d1999 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aX-ray fluorescence spectrometry /$fRon Jenkins 205 $a2nd ed. 210 $aNew York $cWiley$dc1999 215 $a1 online resource (230 p.) 225 0 $aChemical analysis ;$vv. 152 300 $a"A Wiley-Interscience publication." 311 08$a9780471299424 311 08$a0471299421 320 $aIncludes bibliographical references and index. 327 $aX-Ray Fluorescence Spectrometry; CONTENTS; PREFACE TO THE FIRST EDITION; PREFACE TO THE SECOND EDITION; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1 PRODUCTION AND PROPERTIES X-RAYS; 1.1 Introduction; 1.2 Continuous Radiation; 1.3 Characteristic Radiation; 1.4 Absorption of X-Rays; 1.5 Coherent and Incoherent Scattering; 1.6 Interference and Diffraction; Bibliography; CHAPTER 2 INDUSTRIAL APPLICATIONS OF X-RAYS; 2.1 Introduction; 2.2 Diagnostic Uses of X-Rays; 2.3 Tomography; 2.4 Level and Thickness Gauging; 2.5 X-Ray Thickness Gauging; 2.6 Nondestructive Testing 327 $a2.7 Security Screening Systems2.8 X-Ray Lithography; 2.9 X-Ray Astronomy; Bibliography; CHAPTER 3 X-RAY DIFFRACTION; 3.1 Use of X-Ray Diffraction to Study the Crystalline State; 3.2 The Powder Method; 3.3 Use of X-Ray Powder Cameras; 3.4 The Powder Diffractometer; 3.5 Qualitative Applications of the X-Ray Powder Method; 3.6 Quantitative Methods in X-Ray Powder Diffraction; 3.7 Other Applications of X-Ray Diffraction; Bibliography; CHAPTER 4 X-RAY SPECTRA; 4.1 Introduction; 4.2 Electron Configuration of the Elements; 4.3 Fluorescent Yield; 4.4 Relationship Between Wavelength and Atomic Number 327 $a4.5 Normal Transitions (Diagram Lines)4.6 Satellite Lines; 4.7 Characteristic Line Spectra; 4.8 K Spectra; 4.9 L Spectra; 4.10 M Spectra; Bibliography; CHAPTER 5 HISTORY AND DEVELOPMENT OF X-RAY FLUORESCENCE SPECTROMETRY; 5.1 Historical Development of X-Ray Spectrometry; 5.2 Early Ideas About X-Ray Fluorescence; 5.3 Rebirth of X-Ray Fluorescence; 5.4 Evolution of Hardware Control Methods; 5.5 The Growing Role of X-Ray Fluorescence Analysis in Industry and Research; 5.6 The Arrival of Energy Dispersive Spectrometry; 5.7 Evolution of Mathematical Correction Procedures 327 $a5.8 X-Ray Analysis in the 1970s5.9 More Recent Development of X-Ray Fluorescence; Bibliography; CHAPTER 6 INSTRUMENTATION FOR X-RAY SPECTROMETRY; 6.1 Introduction; 6.2 Excitation of X-Rays; 6.3 Detection of X-Rays; 6.4 Wavelength Dispersive Spectrometers; 6.5 Energy Dispersive Spectrometers; Bibliography; CHAPTER 7 COMPARISON OF WAVELENGTH AND ENERGY DISPERSIVE SPECTROMETERS; 7.1 Introduction; 7.2 The Measurable Atomic Number Range; 7.3 The Resolution of Lines; 7.4 Measurement of Low Concentrations; 7.5 Qualitative Analysis 327 $a7.6 Geometric Constraints of Wavelength and Energy Dispersive SpectrometersBibliography; CHAPTER 8 MORE RECENT TRENDS IN X-RAY FLUORESCENCE INSTRUMENTATION; 8.1 The Role of X-Ray Fluorescence in Industry and Research; 8.2 Scope of the X-Ray Fluorescence Method; 8.3 The Determination of Low Atomic Number Elements; 8.4 Total Reflection X-Ray Fluorescence; 8.5 Synchrotron Source X-Ray Fluorescence-SSXRF; 8.6 Proton Induced X-Ray Fluorescence; Bibliography; CHAPTER 9 SPECIMEN PREPARATION AND PRESENTATION; 9.1 Form of the Sample for X-Ray Analysis; 9.2 Direct Analysis of Solid Samples 327 $a9.3 Preparation of Powder Samples 330 $aX-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.Ron Jenkins draws on his exte 410 0$aChemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications 606 $aX-ray spectroscopy 606 $aFluorescence spectroscopy 615 0$aX-ray spectroscopy. 615 0$aFluorescence spectroscopy. 676 $a543/.08586 700 $aJenkins$b Ron$f1932-$052234 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911018813403321 996 $aX-ray fluorescence spectrometry$9766246 997 $aUNINA