LEADER 01648oam 2200457zu 450 001 996212464703316 005 20210807003356.0 035 $a(CKB)111026746721648 035 $a(SSID)ssj0000396609 035 $a(PQKBManifestationID)12101415 035 $a(PQKBTitleCode)TC0000396609 035 $a(PQKBWorkID)10335795 035 $a(PQKB)10706348 035 $a(EXLCZ)99111026746721648 100 $a20160829d1998 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aIWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu 210 31$a[Place of publication not identified]$cIEEE$d1998 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a0-7803-4338-7 606 $aSemiconductors$xStatistical methods$xCharacterization$vCongresses 606 $aSemiconductors$xMeasurement$vCongresses 606 $aElectrical Engineering$2HILCC 606 $aElectrical & Computer Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aSemiconductors$xStatistical methods$xCharacterization 615 0$aSemiconductors$xMeasurement 615 7$aElectrical Engineering 615 7$aElectrical & Computer Engineering 615 7$aEngineering & Applied Sciences 676 $a621.3815/2 712 02$aIEEE Electron Devices Society 712 12$aInternational Workshop on Statistical Metrology 801 0$bPQKB 906 $aPROCEEDING 912 $a996212464703316 996 $aIWSM : 1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu$92506155 997 $aUNISA LEADER 02872nam 2200481zu 450 001 9911006919303321 005 20250627194348.0 010 $a1-62198-227-0 035 $a(CKB)2670000000525593 035 $a(SSID)ssj0000890059 035 $a(PQKBManifestationID)12446351 035 $a(PQKBTitleCode)TC0000890059 035 $a(PQKBWorkID)10883136 035 $a(PQKB)24197359 035 $a(EXLCZ)992670000000525593 100 $a20160829d2013 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aDesign and analysis of experiments 205 $a8th ed. 210 31$a[Place of publication not identified]$cJohn Wiley & Sons Inc$d2013 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a1-118-14692-1 327 $aMachine generated contents note: Chapter 1: Introduction Chapter 2: Simple Comparative Experiments Chapter 3: Experiments with a Single Factor: The Analysis of Variance Chapter 4: Randomized Blocks, Latin Squares, and Related Designs Chapter 5: Introduction to Factorial Designs Chapter 6: The 2k Factorial Design Chapter 7: Blocking and Confounding in the 2k Factorial Design Chapter 8: Two-Level Fractional Factorial Designs Chapter 9: Additional Design and Analysis for Factorial and Fractional Factorial Designs Chapter 10: Fitting Regression Models Chapter 11: Response Surface Methods and Designs Chapter 12: Robust Parameter Design and Process Robustness Studies Chapter 13: Experiments with Random Factors Chapter 14: Nested and Split-Plot Designs Chapter 15: Other Design and Analysis Topics Appendix . 330 $a"The eighth edition of Design and Analysis of Experiments continues to provide extensive and in-depth information on engineering, business, and statistics-as well as informative ways to help readers design and analyze experiments for improving the quality, efficiency and performance of working systems. Furthermore, the text maintains its comprehensive coverage by including: new examples, exercises, and problems (including in the areas of biochemistry and biotechnology); new topics and problems in the area of response surface; new topics in nested and split-plot design; and the residual maximum likelihood method is now emphasized throughout the book"--$cProvided by publisher. 606 $aExperimental design 606 $aMathematics$2HILCC 606 $aPhysical Sciences & Mathematics$2HILCC 606 $aMathematical Statistics$2HILCC 615 0$aExperimental design. 615 7$aMathematics 615 7$aPhysical Sciences & Mathematics 615 7$aMathematical Statistics 676 $a519.5/7 686 $aTEC009060$2bisacsh 700 $aMontgomery$b Douglas C.$09293 801 0$bPQKB 906 $aBOOK 912 $a9911006919303321 996 $aDesign and analysis of experiments$978439 997 $aUNINA