LEADER 02742nam 22005534a 450 001 9911006882903321 005 20200520144314.0 010 $a1-281-97132-4 010 $a9786611971328 010 $a1-61583-316-1 010 $a1-84919-001-1 035 $a(CKB)1000000000692747 035 $a(EBL)407960 035 $a(OCoLC)437247405 035 $a(SSID)ssj0000293996 035 $a(PQKBManifestationID)11195924 035 $a(PQKBTitleCode)TC0000293996 035 $a(PQKBWorkID)10303730 035 $a(PQKB)11558122 035 $a(MiAaPQ)EBC407960 035 $a(EXLCZ)991000000000692747 100 $a20061011d2003 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aDigital and analogue instrumentation $etesting and measurement /$fNihal Kularatna 210 $aLondon $cInstitution of Electrical Engineers$dc2003 215 $a1 online resource (677 p.) 225 1 $aIEE electrical measurement series ;$vv. 11 300 $aDescription based upon print version of record. 311 $a0-85296-999-6 320 $aIncludes bibliographical references and index. 327 $aIntroduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments. 330 $aA substantial update of his earlier book ""Modern Electronic Test and Measuring Instruments"" (IEE, 1996), the author provides a state-of-the art review of modern families of digital instruments. For each family he covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint. New enabling semiconductor technology including data converters, signal processors and modern sensors offers new capabilities to instrument designers and the book treats new digital instrument families such as DSOs, Arbitrary Function Generators, FFT an 410 0$aIEE electrical measurement series ;$v11. 606 $aElectronic instruments$xTesting 615 0$aElectronic instruments$xTesting. 676 $a621.381548 700 $aKularatna$b Nihal$0903313 712 02$aInstitution of Electrical Engineers. 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911006882903321 996 $aDigital and analogue instrumentation$94391846 997 $aUNINA