LEADER 05353nam 2200649Ia 450 001 9911006784303321 005 20200520144314.0 010 $a1-282-28880-6 010 $a9786612288807 010 $a0-08-094957-6 035 $a(CKB)1000000000789517 035 $a(EBL)452872 035 $a(OCoLC)488709610 035 $a(SSID)ssj0000331961 035 $a(PQKBManifestationID)12099973 035 $a(PQKBTitleCode)TC0000331961 035 $a(PQKBWorkID)10331380 035 $a(PQKB)10961060 035 $a(MiAaPQ)EBC452872 035 $a(PPN)182566684 035 $a(EXLCZ)991000000000789517 100 $a20090302d2009 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aAtomic force microscopy in process engineering $eintroduction to AFM for improved processes and products /$fW. Richard Bowen and Nidal Hilal 205 $a1st ed. 210 $aAmsterdam ;$aBoston $cElsevier/BH$dc2009 215 $a1 online resource (300 p.) 300 $aDescription based upon print version of record. 311 $a1-85617-517-0 320 $aIncludes bibliographical references (p. 270-274) and index. 327 $aFront Cover; Atomic Force Microscopy in Process Engineering: Introduction to AFM for Improved Processes and Products; Copyright Page; Contents; Preface; About the Editors; List of Contributors; Chapter 1 Basic Principles of Atomic Force Microscopy; 1.1 Introduction; 1.2 The Atomic Force Microscope; 1.3 Cantilevers and Probes; 1.4 Imaging Modes; 1.5 The AFM as a Force Sensor; 1.6 Calibration of AFM Microcantilevers; 1.7 Colloid Probes; Abbreviations and Symbols; Chapter 2 Measurement of Particle and Surface Interactions Using Force Microscopy; 2.1 Introduction; 2.2 Colloid Probes 327 $a2.3 Interaction Forces2.4 Adhesion Forces Measured by AFM; 2.5 Effect of Roughness on Measured Adhesion and Surface Forces; Abbreviations and Symbols; Greek Symbols; Chapter 3 Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy; 3.1 Introduction; 3.2 Particle-Bubble Interactions; 3.3 Determination of Particle-Bubble Separation; 3.4 Determination of Contact Angle from Force-Distance Curves; 3.5 Effect of Surface Preparation on Particle-Bubble Interactions; 3.6 Effect of Loading Force on Particle-Bubble Interactions 327 $a3.7 Effect of Hydrodynamics on Particle-Bubble Interactions3.8 Conclusions; List of Abbreviations; List of Symbols; Chapter 4 Investigating Membranes and Membrane Processes with Atomic Force Microscopy; 4.1 Introduction; 4.2 The Range of Possibilities for Investigating Membranes; 4.3 Correspondence between Surface Pore Dimensions from AFM and MWCO; 4.4 Imaging in Liquid and the Determination of Surface Electrical Properties; 4.5 Effects of Surface Roughness on Interactions with Particles; 4.6 'Visualisation' of the Rejection of a Colloid by a Membrane Pore and Critical Flux 327 $a4.7 The Use of AFM in Membrane Development4.8 Characterisation of Metal Surfaces; 4.9 Conclusions; Acknowledgements; List of Abbreviations; Chapter 5 AFM and Development of (Bio)Fouling-Resistant Membranes; 5.1 Introduction; 5.2 Measurement of Adhesion of Colloidal Particles and Cells to Membrane Surfaces; 5.3 Modification of Membranes; 5.4 Modification of Membranes with Sulphonated Poly(Ether-Ether Ketone) Polymers; 5.5 Conclusions; Acknowledgements; Abbreviations and Symbols; Chapter 6 Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy; 6.1 Introduction 327 $a6.2 The AFM as a Force Measurement Tool in Pharmaceuticals6.3 AFM Imaging-Based Studies; 6.4 Micro- and Nanothermal Characterisation with SPM; 6.5 Conclusions; Acknowledgements; Abbreviations and Symbols; Chapter 7 Micro/Nanoengineering and AFM for Cellular Sensing; 7.1 Introduction; 7.2 Engineering the ECM for Probing Cell Sensing; 7.3 AFM in Cell Measurement; 7.4 Conclusions; Acknowledgements; Abbreviations and Symbols; Chapter 8 Atomic Force Microscopy and Polymers on Surfaces; 8.1 Introduction; 8.2 Basic Concepts; 8.3 End-grafted Polymer Chains; 8.4 Diblock Copolymers Adsorbed on Surfaces 327 $a8.5 Star-shaped Polymers Adsorbed on Surfaces 330 $aAtomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products. This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practis 606 $aAtomic force microscopy 606 $aProduction engineering 615 0$aAtomic force microscopy. 615 0$aProduction engineering. 676 $a502.82 676 $a660.2812 676 $a502.82 700 $aBowen$b W. Richard$0948386 701 $aHilal$b Nidal$01825462 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911006784303321 996 $aAtomic force microscopy in process engineering$94393147 997 $aUNINA