LEADER 03035nam 2200613Ia 450 001 9911006694703321 005 20200520144314.0 010 $a1-61353-090-0 010 $a1-61344-286-6 035 $a(CKB)3330000000000159 035 $a(EBL)1183040 035 $a(OCoLC)854971711 035 $a(SSID)ssj0000550793 035 $a(PQKBManifestationID)12200192 035 $a(PQKBTitleCode)TC0000550793 035 $a(PQKBWorkID)10523916 035 $a(PQKB)10003343 035 $a(MiAaPQ)EBC1183040 035 $a(EXLCZ)993330000000000159 100 $a20090428d2010 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aRF and microwave modeling and measurement techniques for field effect transistors /$fJianjun Gao 210 $aRaleigh, NC $cSciTech Pub.$dc2010 215 $a1 online resource (351 p.) 300 $aDescription based upon print version of record. 311 $a1-891121-89-8 320 $aIncludes bibliographical references and index. 327 $aContents; Preface; Chapter 1 - Introduction; Chapter 2 - Representation of Microwave Two-Port Network; Chapter 3 - Microwave and RF Measurement Techniques; Chapter 4 - FET Small Signal Modeling and ParameterExtraction; Chapter 5 - FET Nonlinear Modeling and ParameterExtraction; Chapter 6 - Microwave Noise Modeling and ParameterExtraction Technique for FETs; Chapter 7 - Artificial Neural Network Modeling Techniquefor FET; References; Index 330 $aThis book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such 606 $aField-effect transistors$xTesting 606 $aCompound semiconductors$xTesting 606 $aField-effect transistors$xMathematical models 606 $aCompound semiconductors$xMathematical models 606 $aMicrowave measurements 606 $aRadio measurements 615 0$aField-effect transistors$xTesting. 615 0$aCompound semiconductors$xTesting. 615 0$aField-effect transistors$xMathematical models. 615 0$aCompound semiconductors$xMathematical models. 615 0$aMicrowave measurements. 615 0$aRadio measurements. 676 $a621.3815/284 700 $aGao$b Jianjun$f1968-$01617788 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911006694703321 996 $aRF and microwave modeling and measurement techniques for field effect transistors$94390367 997 $aUNINA