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010   $a0-8155-1634-7
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035   $a(PQKBManifestationID)11971831
035   $a(PQKBTitleCode)TC0000071553
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035   $a(EXLCZ)99111056552535310
100   $a20160829d1989      uy 
101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 00$aCharacterization of semiconductor materials : principles and methods
210 31$a[Place of publication not identified]$cNoyes Publications$d1989
225 0 $aMaterials science and process technology series Characterization of semiconductor materials 
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8155-1200-7 
606   $aSemiconductors$vHandbooks, manuals, etc
606   $aPhysics$2HILCC
606   $aPhysical Sciences & Mathematics$2HILCC
606   $aElectricity & Magnetism$2HILCC
615  0$aSemiconductors
615  7$aPhysics
615  7$aPhysical Sciences & Mathematics
615  7$aElectricity & Magnetism
676   $a621.3815/2
702   $aMcGuire$b G. E
801  0$bPQKB
906   $aBOOK
912   $a9911006670803321
996   $aCharacterization of semiconductor materials : principles and methods$94392109
997   $aUNINA