LEADER 02228nam 2200541Ia 450 001 9911006502903321 005 20240410151520.0 010 $a1-62708-260-3 010 $a1-62198-291-2 010 $a1-61503-236-3 035 $a(CKB)2560000000049812 035 $a(CtWfDGI)bke00042660 035 $a(SSID)ssj0000485874 035 $a(PQKBManifestationID)11347169 035 $a(PQKBTitleCode)TC0000485874 035 $a(PQKBWorkID)10430402 035 $a(PQKB)10608705 035 $a(Au-PeEL)EBL3002413 035 $a(CaPaEBR)ebr10323498 035 $a(OCoLC)929147738 035 $a(MiAaPQ)EBC3002413 035 $a(EXLCZ)992560000000049812 100 $a19990303e19991984 uy 0 101 0 $aeng 135 $aurzn|||||| 181 $ctxt 182 $cc 183 $acr 200 10$aMetallography, principles and practice /$fGeorge F. Vander Voort 210 $aMaterials Park, OH $cASM International$dc1999 215 $axiv, 752 p. $cill. (some col.) 300 $aOriginally published: New York : McGraw-Hill, c1984. 311 $a0-87170-672-5 320 $aIncludes bibliographical references and indexes. 327 $aIntro -- CONTENTS -- PREFACE -- MACROSTRUCTURE -- SPECIMEN PREPARATION FOR LIGHT MICROSCOPY -- MICROSTRUCTURE -- LIGHT MICROSCOPY -- HARDNESS -- QUANTITATIVE MICROSCOPY -- ETCHANTS FOR REVEALING MACROSTRUCTURE -- MACROETCHANTS BASED ON COPPER- CONTAINING COMPOUNDS- FOR ETCHING OF IRON AND STEEL -- MACROETCHANTS FOR REVEALING STRAIN PATTERNS IN NONFERROUS METALS -- ELECTROLESS AND ELECTROLYTIC PLATING PROCEDURES -- ELECTROMECHANICAL POLISHING PROCEDURES -- ATTACK POLISHING PROCEDURES -- CHEMICAL POLISHING SOLUTIONS -- ELECTROLYTIC POLISHING SOLUTIONS -- ETCHANTS FOR REVEALING MICROSTRUCTURE -- DISLOCATION ETCHING TECHNIQUES -- NAME INDEX -- SUBJECT INDEX. 606 $aMetallography 606 $aPhysical metallurgy 615 0$aMetallography. 615 0$aPhysical metallurgy. 676 $a669/.95 700 $aVander Voort$b George F$01232767 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911006502903321 996 $aMetallography, principles and practice$94390262 997 $aUNINA