LEADER 04037nam 2200673 a 450 001 9911004850103321 005 20200520144314.0 010 $a1-283-29379-X 010 $a9786613293794 010 $a1-4377-7884-4 035 $a(CKB)2550000000048212 035 $a(EBL)858639 035 $a(OCoLC)776108189 035 $a(SSID)ssj0000630406 035 $a(PQKBManifestationID)12254414 035 $a(PQKBTitleCode)TC0000630406 035 $a(PQKBWorkID)10745760 035 $a(PQKB)11068417 035 $a(MiAaPQ)EBC858639 035 $a(PPN)167710109 035 $a(EXLCZ)992550000000048212 100 $a20111128d2012 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aDevelopments in surface contamination and cleaning$hVolume four$iDetection, characterization, and analysis of contaminants /$fedited by Rajiv Kohli and K.L. Mittal 205 $a1st ed. 210 $aAmsterdam $cWilliam Andrew$d2012 215 $a1 online resource (361 p.) 300 $aDescription based upon print version of record. 311 $a0-12-810368-X 311 $a1-4377-7883-6 320 $aIncludes bibliographical references and index. 327 $aFront Cover; Developments in Surface Contamination and Cleaning; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1 - Basics and Sampling of Particles for Size Analysis and Identification; 1.Introduction and basics; 2.Sampling; 3.Solvents and solubility parameters; 4.Cleanroom airflows and their consideration in contamination sampling; 5.Summary; References; Chapter 2 - Computational Fluid Dynamics of Particle Transport and Deposition; 1 Introduction; 2 Formulation; 3 Applications; 4 Conclusions; Acknowledgments; References 327 $aChapter 3 - Methods for Monitoring and Measuring Cleanliness of Surfaces1 Introduction; 2 Types of Contaminants; 3 Product Cleanliness Levels; 4 Methods for Monitoring Surface Cleanliness; 5 Summary; Disclaimer; Acknowledgment; References; Chapter 4 - Size Analysis and Identification of Particles; 1 Introduction; 2 Particle Identification; 3 Summary; References; Chapter 5 - Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features; 1 Introduction; 2 Impact of Contaminants; 3 Nature and Size of Particles 327 $a4 Recent Developments in Characterization Techniques5 Miscellaneous Innovative Applications of Characterization Methods; 6 Summary; Disclaimer; References; Chapter 6 - Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions; 1 Introduction; 2 AFM - Modes of Operation; 3 Adhesion Forces; 4 Application of AFM; 5 Summary; References; Index 330 $a In this series Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or handling the consequences of surface contamination. The expert contributions in this volume cover important fundamental aspects of surface contamination that are key to understanding the behavior of specific types of contaminants. This understanding is essential to develop preventative and mitigation methods for contamination cont 606 $aSurfaces (Technology)$xInspection 606 $aSurface contamination$xPrevention 606 $aCleaning 606 $aCoatings 606 $aDust control 615 0$aSurfaces (Technology)$xInspection. 615 0$aSurface contamination$xPrevention. 615 0$aCleaning. 615 0$aCoatings. 615 0$aDust control. 676 $a620.44 701 $aKohli$b Rajiv$0312362 701 $aMittal$b K. L$01185827 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911004850103321 996 $aDevelopments in surface contamination and cleaning$94390211 997 $aUNINA