LEADER 04070nam 2200589 a 450 001 9911004825403321 005 20200520144314.0 010 $a1-61583-700-0 010 $a0-8194-8039-8 024 7 $a10.1117/3.374903 035 $a(CKB)2470000000003000 035 $a(EBL)728506 035 $a(OCoLC)606697052 035 $a(SSID)ssj0000386850 035 $a(PQKBManifestationID)11266711 035 $a(PQKBTitleCode)TC0000386850 035 $a(PQKBWorkID)10400301 035 $a(PQKB)10819072 035 $a(MiAaPQ)EBC728506 035 $a(CaBNVSL)gtp00538495 035 $a(SPIE)9780819480392 035 $a(PPN)237384205 035 $a(EXLCZ)992470000000003000 100 $a20000317d2001 uy 0 101 0 $aeng 135 $aurbn||||m|||a 181 $ctxt 182 $cc 183 $acr 200 00$aScientific charge-coupled devices /$fJames R. Janesick, editor 210 $aBellingham, Wash. $cSPIE Press$dc2001 215 $a1 online resource (920 p.) 225 1 $aSPIE Press monograph ;$vPM83 300 $aDescription based upon print version of record. 311 $a0-8194-3698-4 320 $aIncludes bibliographical references and index. 327 $aAcronyms and abbreviations -- Preface -- 1. Introduction. 1.1. Photon transfer history and application; 1.2. Photon transfer family; 1.3. Chapter review -- 2. Photon interaction. 2.1. Photoelectric effect; 2.2. Quantum efficiency; 2.3. Quantum yield -- 3. Photon transfer noise sources. 3.1. Photon shot noise; 3.2. Signal shot noise; 3.3. Fano noise; 3.4. Fixed pattern noise; 3.5. Read noise -- 4. Photon transfer theory. 4.1. Photon transfer relation; 4.2. Sense node sensitivities; 4.3. Interacting photon sensitivities; 4.4. Incident photon sensitivities; 4.5. Photon transfer general derivation; 4.6. Effective quantum yield -- 5. Photon transfer curve. 5.1. PTC setup and generation; 5.2. PTC family; 5.3. PTC errors; 5.4. Shutterless (time-delayed integration) PTC; 5.5. Variance PTC; 5.6. Example experimental PTC data -- 6. e-/DN Variance 79 -- 7. Nonlinearity.7.1. Introduction; 7.2. V/V nonlinearity; 7.3. V/e- nonlinearity. 327 $a8. Flat fielding. 8.1. Theory; 8.2. Photon transfer verification; 8.3. Nonlinearity -- 9. Modulation photon transfer. 9.1. Introduction; 9.2. Sinusoidal signal; 9.3. Sinusoidal noise; 9.4. Modulation PTC -- 10. Signal-to-noise performance. 10.1. Uniform stimulus; 10.2. Image S/N performance; 10.3. Flat fielding; 10.4. Image averaging; 10.5. On-chip averaging -- 11. Read noise. 11.1. Introduction; 11.2. Pixel source follower noise; 11.3. Sense node reset noise; 11.4. Dark current noise; 11.5. ADC quantizing noise; 11.6. Offset fixed pattern noise; 11.7. System noise -- 12. Lux transfer. 12.1. Introduction; 12.2. Minimum detection limit; 12.3. Responsivity; 12.4. Modulation LTC; 12.5. Acceptable image; 12.6. LTC ratio; 12.7. LTC data sequence -- Appendix A. PTC data reduction example -- Appendix B. PTC simulation program with thermal dark current -- Appendix C. PTC simulation program with FPN removal through flat fielding -- Appendix D. LTC simulation program with thermal dark current -- Table of symbols -- References -- Index. 330 $aThe invention of the charge-coupled device 30 years ago was the beginning of a remarkable image capture technology that has changed the course of imaging in fields ranging from astronomy to biotechnology. This book presents a comprehensive history, tutorial, and state-of-the-art description of CCDs and is intended for scientists, engineers, imaging hardware managers, and graduate students. 410 0$aSPIE Press monograph ;$vPM83. 606 $aCharge coupled devices 615 0$aCharge coupled devices. 676 $a621.36/7 701 $aJanesick$b James R$01823151 712 02$aSociety of Photo-optical Instrumentation Engineers. 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911004825403321 996 $aScientific charge-coupled devices$94389648 997 $aUNINA LEADER 02511oam 2200673I 450 001 9910964796303321 005 20251116144640.0 010 $a1-134-86852-9 010 $a1-280-18251-2 010 $a0-203-30408-X 010 $a1-134-86853-7 010 $a0-203-04868-7 024 7 $a10.4324/9780203048689 035 $a(CKB)1000000000006490 035 $a(EBL)168884 035 $a(OCoLC)70720465 035 $a(SSID)ssj0000283237 035 $a(PQKBManifestationID)11228235 035 $a(PQKBTitleCode)TC0000283237 035 $a(PQKBWorkID)10249766 035 $a(PQKB)10191594 035 $a(SSID)ssj0000229856 035 $a(PQKBManifestationID)11173924 035 $a(PQKBTitleCode)TC0000229856 035 $a(PQKBWorkID)10173058 035 $a(PQKB)11630855 035 $aebr10017053 035 $a(MiAaPQ)EBC168884 035 $a(Au-PeEL)EBL168884 035 $a(CaPaEBR)ebr10070550 035 $a(CaONFJC)MIL18251 035 $a(OCoLC)50297802 035 $a(EXLCZ)991000000000006490 100 $a20180331d1993 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aPseudo-problems $ehow analytic philosophy gets done /$fRoy A. Sorensen 205 $a1st ed. 210 1$aLondon ;$aNew York :$cRoutledge,$d1993. 215 $a1 online resource (304 p.) 300 $aDescription based upon print version of record. 311 08$a1-138-98404-3 311 08$a0-415-09464-X 320 $aIncludes bibliographical references (p. [273]-281) and indexes. 327 $aQuestion quality control -- Get 'real'! -- Problems with 'pseudo-problems' -- The soft consensual underbelly of dispute; #?'!+@mean@ingl ss*ne -- The devil's volleyball -- Popped presuppositions -- The unity of opposites -- Forging the stream of consciousness -- Beyond our ken -- The edge of reason -- Undermining the undeserving -- Enlightened tasks -- Depth. 330 $aA fast-moving, fascinating alternative history of twentieth century analytic philosophy. Using many examples, Sorenson explains how problems are dissolved rather than solved. This is a fine example of what philosophical analysis should be. 606 $aAnalysis (Philosophy) 615 0$aAnalysis (Philosophy) 676 $a146/.4 700 $aSorensen$b Roy A.$0464350 801 0$bFlBoTFG 801 1$bFlBoTFG 906 $aBOOK 912 $a9910964796303321 996 $aPseudo-problems$94494810 997 $aUNINA