LEADER 01497nam 2200433I 450 001 9910705786403321 005 20170613072112.0 035 $a(CKB)5470000002452539 035 $a(OCoLC)989973486 035 $a(EXLCZ)995470000002452539 100 $a20170613j201701 ua 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aDesign guide for aerodynamics testing of Earth and planetary entry vehicles in a ballistic range /$fDavid W. Bogdanoff 210 1$a[Moffett Field, California] :$cNational Aeronautics and Space Administration, [Ames Research Cente]r,$dJanuary, 2017. 215 $a1 online resource (79 pages) $ccolor illustrations 225 1 $aNASA technical memorandum ;$v2017-219473 300 $a"January, 2017." 606 $aAerodynamic drag$2nasat 606 $aAerodynamics$2nasat 606 $aAngle of attack$2nasat 606 $aFlight paths$2nasat 606 $aReynolds number$2nasat 615 7$aAerodynamic drag. 615 7$aAerodynamics. 615 7$aAngle of attack. 615 7$aFlight paths. 615 7$aReynolds number. 700 $aBogdanoff$b D. W$g(David W.),$01393179 712 02$aAmes Research Center, 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910705786403321 996 $aDesign guide for aerodynamics testing of Earth and planetary entry vehicles in a ballistic range$93454285 997 $aUNINA LEADER 03662nam 2200673 a 450 001 9910973743503321 005 20200520144314.0 010 $a1-04-007522-3 010 $a0-429-17625-2 010 $a1-4822-8934-2 010 $a1-4200-1725-X 010 $a1-282-77797-1 010 $a9786612777974 010 $a0-203-18425-4 024 7 $a10.1201/9781482289343 035 $a(UkCvUL)(CKB)1000000000002452 035 $a(UkCvUL)(EBL)168520 035 $a(UkCvUL)(OCoLC)62589237 035 $a(UkCvUL)(SSID)ssj0000278993 035 $a(UkCvUL)(PQKBManifestationID)11211539 035 $a(UkCvUL)(PQKBTitleCode)TC0000278993 035 $a(UkCvUL)(PQKBWorkID)10260528 035 $a(UkCvUL)(PQKB)11140436 035 $a(UkCvUL)(MiAaPQ)EBC168520 035 $a(UkCvUL)991000000000002452 035 $a(OCoLC)1027753151 035 $a(CKB)1000000000002452 035 $a(MiAaPQ)EBC168520 035 $a(EXLCZ)991000000000002452 100 $a20010730d2001 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aElectron microscopy and analysis /$fPeter J. Goodhew, John Humphreys, Richard Beanland 205 $a3rd ed. 210 $aLondon $cTaylor & Francis$d2001 215 $a1 online resource (262 p.) 300 $aPrevious ed.: 1988. 311 08$a1-138-44153-8 311 08$a0-7484-0968-8 320 $aIncludes bibliographical references and index. 327 $aBook Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction 327 $aThe geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu 330 2 $a"Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook."--Provided by publisher. 606 $aElectron microscopy 615 0$aElectron microscopy. 676 $a502.825 700 $aGoodhew$b Peter J$0477169 701 $aBeanland$b R$01829109 701 $aHumphreys$b F. J$0627393 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910973743503321 996 $aElectron microscopy and analysis$94398275 997 $aUNINA