LEADER 01755nam 2200385 450 001 996280214203316 005 20230425080556.0 010 $a1-4673-6578-5 024 7 $a10.1109/ITC33753.2015 035 $a(CKB)3710000000534614 035 $a(NjHacI)993710000000534614 035 $a(EXLCZ)993710000000534614 100 $a20230425d2015 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aTest Conference (ITC), 2015 IEEE International /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, NJ :$cIEEE,$d2015. 215 $a1 online resource (various pagings) $cillustrations 311 $a1-4673-6579-3 330 $aInternational Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers. 517 $a2015 IEEE International Test Conference 517 $a2015 IEEE International Test Conference (ITC) 517 $aTest Conference 606 $aComputer software$xTesting$vCongresses 615 0$aComputer software$xTesting 676 $a005.14 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a996280214203316 996 $aTest Conference (ITC), 2015 IEEE International$92536343 997 $aUNISA LEADER 02480nam 2200721 a 450 001 9910972680603321 005 20251117084518.0 010 $a9783110807585 010 $a3110807580 024 7 $a10.1515/9783110807585 035 $a(CKB)2670000000236098 035 $a(EBL)3040625 035 $a(SSID)ssj0000625999 035 $a(PQKBManifestationID)11382956 035 $a(PQKBTitleCode)TC0000625999 035 $a(PQKBWorkID)10629217 035 $a(PQKB)10627477 035 $a(MiAaPQ)EBC3040625 035 $a(WaSeSS)Ind00020649 035 $a(DE-B1597)42675 035 $a(OCoLC)979691471 035 $a(DE-B1597)9783110807585 035 $a(Au-PeEL)EBL3040625 035 $a(CaPaEBR)ebr10588470 035 $a(CaONFJC)MIL558558 035 $a(OCoLC)922943568 035 $a(Perlego)653073 035 $a(BIP)30768013 035 $a(BIP)1714239 035 $a(EXLCZ)992670000000236098 100 $a20770816e19772011 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aWestern expansion and Indigenous peoples $ethe heritage of Las Casas /$feditor, Eli?as Sevilla-Casas 205 $aReprint 2011 210 $aThe Hague $cMouton ;$aChicago $cdistributed in the USA and Canada by Aldine$dc1977 215 $a1 online resource (321 pages) 225 0 $aWorld Anthropology 300 $aPapers presented during the session dedicated to Fray Bartolome? de las Casas. 311 0 $a9789027975102 311 0 $a9027975108 320 $aIncludes bibliographical references and indexes. 327 $asection 1. General theoretical considerations -- section 2. The colonial past in Spanish America -- section 3. The Latin American present. 410 0$aWorld Anthropology 606 $aIndians$xSocial conditions$vCongresses 606 $aIndians, Treatment of$zLatin America$vCongresses 607 $aSpain$xColonies$zAmerica$vCongresses 615 0$aIndians$xSocial conditions 615 0$aIndians, Treatment of 676 $a301.45/19/808 686 $aMS 9500$2rvk 701 $aSevilla Casas$b Eli?as$f1942-$0686140 712 12$aInternational Congress of Anthropological and Ethnological Sciences. 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910972680603321 996 $aWestern expansion and Indigenous peoples$94479708 997 $aUNINA