LEADER 06245nam 22005534a 450 001 9910963983003321 005 20251116153204.0 010 0 $a9780191524691 010 0 $a0191524697 035 $a(MiAaPQ)EBC7034788 035 $a(CKB)24235070000041 035 $a(MiAaPQ)EBC430810 035 $a(Au-PeEL)EBL430810 035 $a(CaPaEBR)ebr10180288 035 $a(CaONFJC)MIL116038 035 $a(OCoLC)609831339 035 $a(Au-PeEL)EBL7034788 035 $a(EXLCZ)9924235070000041 100 $a20060327d2006 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aExperimental techniques for low-temperature measurements $ecryostat design, material properties, and superconductor critical-current testing /$fJack W. Ekin 205 $a1st ed. 210 $aOxford ;$aNew York $cOxford University Press$d2006 215 $axxviii, 673 p. $cill 320 $aIncludes bibliographical references and index. 327 $aIntro -- CONTENTS -- SYMBOLS AND ABBREVIATIONS -- ACKNOWLEDGMENTS -- ABOUT THE AUTHOR -- CONTACT INFORMATION -- DISCLAIMER -- PART I: CRYOSTAT DESIGN AND MATERIALS SELECTION -- 1 Introduction to Measurement Cryostats and Cooling Methods -- 1.1 Introduction -- 1.2 Cryogenic liquids -- 1.3 Introduction to measurement cryostats -- 1.4 Examples of measurement cryostats and cooling methods-low transport current ((omitted) 1 A) -- 1.5 Examples of measurement cryostats and cooling methods-high transport current ((omitted) 1 A) -- 1.6 Addenda: safety and cryogen handling -- 1.7 References -- 2 Heat Transfer at Cryogenic Temperatures -- 2.1 Introduction -- 2.2 Heat conduction through solids -- 2.3 Heat conduction through gases (and liquids) -- 2.4 Radiative heat transfer -- 2.5 Heat conduction across liquid/solid interfaces -- 2.6 Heat conduction across solid/solid interfaces -- 2.7 Heat conduction across solid/gas interfaces -- 2.8 Other heat sources -- 2.9 Examples of heat-transfer calculation -- 2.10 References -- 3 Cryostat Construction -- 3.1 Introduction -- 3.2 Material selection for cryostat parts -- 3.3 Joining techniques -- 3.4 Construction example for a basic dipper probe -- 3.5 Sizing of parts for mechanical strength -- 3.6 Mechanical motion at cryogenic temperature -- 3.7 Vacuum techniques and seals for cryogenic use -- 3.8 Addenda: high and ultrahigh vacuum techniques -- 3.9 References -- 4 Wiring and Connections -- 4.1 Introduction -- 4.2 Wire selection -- 4.3 Insulation selection -- 4.4 Heat sinks for instrumentation leads -- 4.5 Solder connections -- 4.6 Sensitive dc voltage leads: techniques for minimizing thermoelectric voltages -- 4.7 Vacuum electrical lead-throughs -- 4.8 Radio-frequency coaxial cables -- 4.9 High-current leads -- 4.10 Flexible current leads -- 4.11 References -- 5 Temperature Measurement and Control. 327 $a5.1 Thermometer selection (1-300 K) -- 5.2 Selection of thermometers for use in high magnetic fields -- 5.3 Thermometer installation and measurement procedures -- 5.4 Controlling temperature -- 5.5 Addendum: reference compendium of cryogenic-thermometer properties and application techniques -- 5.6 References -- 6 Properties of Solids at Low Temperatures -- 6.1 Specific heat and thermal diffusivity -- 6.2 Thermal expansion/contraction -- 6.3 Electrical resistivity -- 6.4 Thermal conductivity -- 6.5 Magnetic susceptibility -- 6.6 Mechanical properties -- 6.7 References -- PART II: ELECTRICAL TRANSPORT MEASUREMENTS: SAMPLE HOLDERS AND CONTACTS -- 7 Sample Holders -- 7.1 General principles for sample-holder design -- 7.2 Four-lead and two-lead electrical transport measurements -- 7.3 Bulk sample holders -- 7.4 Thin-film sample holders -- 7.5 Addenda -- 7.6 References -- 8 Sample Contacts -- 8.1 Introduction -- 8.2 Definition of specific contact resistivity and values for practical applications -- 8.3 Contact techniques for high-current superconductors -- 8.4 Contact techniques for film superconductors -- 8.5 Example calculations of minimum contact area -- 8.6 Spreading-resistance effect in thin contact pads and example calculations -- 8.7 References -- PART III: SUPERCONDUCTOR CRITICAL-CURRENT MEASUREMENTS AND DATA ANALYSIS -- 9 Critical-Current Measurements -- 9.1 Introduction -- 9.2 Instrumentation -- 9.3 Measurement procedures -- 9.4 Examples of critical-current measurement cryostats -- 9.5 References -- 10 Critical-Current Data Analysis -- 10.1 Practical critical-current definitions -- 10.2 Current-transfer correction -- 10.3 Magnetic-field dependence of critical current -- 10.4 Temperature dependence of critical current -- 10.5 Strain-induced changes in the critical current. 327 $a10.6 Transformation method for simplified application of scaling relations -- 10.7 Unified strain-and-temperature scaling law and transformations -- 10.8 References -- Appendixes: Data handbook of materials properties and cryostat design -- INDEX -- A -- B -- C -- D -- E -- F -- G -- H -- I -- J -- K -- L -- M -- N -- O -- P -- Q -- R -- S -- T -- U -- V -- W -- Y -- Z. 330 $aWritten in an accessible and readable style, the book provides a truly integrated, step-by-step approach to the design and construction of low-temperature measurement apparatus. It presents a practical perspective of heat transfer, materials selection, construction techniques, wiring, thermometry, sample mounting, and electrical contacts, and recent developments in superconductor data analysis and scaling theory. The graphs, clear examples, and seventy appendixdata tables are a treasure trove of practical information. 606 $aLow temperatures$xMeasurement 606 $aLow temperatures$xInstruments 606 $aLow temperature research 606 $aSuperconductors 615 0$aLow temperatures$xMeasurement. 615 0$aLow temperatures$xInstruments. 615 0$aLow temperature research. 615 0$aSuperconductors. 676 $a536/.54 700 $aEkin$b J. W$01277753 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 912 $a9910963983003321 996 $aExperimental techniques for low-temperature measurements$94465035 997 $aUNINA