LEADER 05612nam 2200805 u 450 001 9910953576703321 005 20240912161201.0 010 $a0-19-773261-5 010 $a1-280-44178-X 010 $a0-19-802281-6 010 $a9786610441785 010 $a0-19-534469-3 010 $a1-60256-628-3 024 7 $a10.1093/oso/9780195092042.001.0001 035 $a(CKB)1000000000033356 035 $a(StDuBDS)AH24082831 035 $a(SSID)ssj0000365581 035 $a(PQKBManifestationID)12136863 035 $a(PQKBTitleCode)TC0000365581 035 $a(PQKBWorkID)10413671 035 $a(PQKB)10043994 035 $a(SSID)ssj0000241578 035 $a(PQKBManifestationID)12031826 035 $a(PQKBTitleCode)TC0000241578 035 $a(PQKBWorkID)10298017 035 $a(PQKB)11563063 035 $a(OCoLC)228117554 035 $a(Au-PeEL)EBL5567791 035 $a(OCoLC)1061127334 035 $a(MiAaPQ)EBC241662 035 $a(OCoLC)1406787133 035 $a(StDuBDS)9780197732618 035 $a(MiAaPQ)EBC5567791 035 $a(EXLCZ)991000000000033356 100 $a19941028e20231994 uy | 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aScanning force microscopy $ewith applications to electric, magnetic, and atomic forces /$fDror Sarid 205 $aRev. ed. 210 1$aNew York ;$cOxford University Press,$d2023. 215 $a1 online resource (xiii,263p. )$cill 225 1 $aOxford series in optical and imaging sciences ;$v5 225 1 $aOxford scholarship online 300 $aPrevious edition: 1991. 300 $aPreviously issued in print: 1994. 311 08$a0-19-506270-1 311 08$a0-19-509204-X 320 $aIncludes bibliographical references and index. 327 $aIntro -- Contents -- PREFACE TO THE REVISED EDITION -- PREFACE -- PART ONE. LEVERS AND NOISE -- Chapter 1 Mechanical Properties of Levers -- 1.1. Introduction -- 1.2. Stress and Strain -- 1.3. Moments -- 1.4. Spring Constant -- 1.5. The Rayleigh Solution to a Vibrating Lever -- 1.6. The Classical Solution to a Vibrating Lever -- 1.7. Normal Modes -- 1.8. Lumped Systems -- 1.9. Examples -- 1.10. Summary -- Chapter 2 Resonance Enhancement -- 2.1. Introduction -- 2.2. Bimorph Driver -- 2.3. Effective Spring Constant -- 2.4. Bimorph-Driven Lever -- 2.5. Sample-Driven Lever -- 2.6. Tip-Driven Lever -- 2.7. Summary -- Chapter 3 Sources of Noise -- 3.1. Introduction -- 3.2. General Discussion of Noise -- 3.3. Shot Noise -- 3.4. Resistor Johnson Noise -- 3.5. Laser Intensity Noise -- 3.6. Laser Phase Noise -- 3.7. Thermally Induced Lever Noise -- 3.8. Bimorph Noise -- 3.9. Lever Noise-Limited SNR -- 3.10. Experimental Characterization of Noise -- 3.11. Summary -- PART TWO. SCANNING FORCE MICROSCOPES -- Chapter 4 Tunneling Detection System -- 4.1. Introduction -- 4.2. Theory -- 4.3. Perpendicular Arrangement -- 4.4. Cross Arrangement -- 4.5. Parallel Arrangement -- 4.6. Serial Arrangement -- 4.7. Single-Lever Arrangement -- 4.8. Summary -- Chapter 5 Capacitance Detection System -- 5.1. Introduction -- 5.2. Theory -- 5.3. Noise Considerations -- 5.4. Performance of Systems -- 5.5. Summary -- Chapter 6 Homodyne Detection System -- 6.1. Introduction -- 6.2. Theory -- 6.3. Noise Considerations -- 6.4. System Performance -- 6.5. Summary -- Chapter 7 Heterodyne Detection System -- 7.1. Introduction -- 7.2. Theory -- 7.3. Noise Considerations -- 7.4. Performance -- 7.5. Summary -- Chapter 8 Laser-Diode Feedback Detection System -- 8.1. Introduction -- 8.2. Theory -- 8.3. Noise Considerations -- 8.4. Performance -- 8.5. Summary. 327 $aChapter 9 Polarization Detection System -- 9.1. Introduction -- 9.2. Theory -- 9.3. Noise Considerations -- 9.4. Performance -- 9.5. Summary -- Chapter 10 Deflection Detection System -- 10.1. Introduction -- 10.2. Theory -- 10.3. Noise Considerations -- 10.4. Performance -- 10.5. Summary -- PART THREE. SCANNING FORCE MICROSCOPY -- Chapter 11 Electric Force Microscopy -- 11.1. Introduction -- 11.2. Basic Concepts -- 11.3. Examples -- 11.4. Principles of Operation -- 11.5. Noise Considerations -- 11.6. Applications -- 11.7. Performance -- 11.8. Summary -- Chapter 12 Magnetic Force Microscopy -- 12.1. Introduction -- 12.2. Basic Concepts -- 12.3. Examples -- 12.4. Principles of Operation -- 12.5. Noise Considerations -- 12.6. Applications -- 12.7. Performance -- 12.8. Summary -- Chapter 13 Atomic Force Microscopy -- 13.1. Introduction -- 13.2. Intermolecular Microscopic Interactions -- 13.3. Intermolecular Macroscopic Interactions -- 13.4. Lever-Tip-Sample Contact Interactions -- 13.5. Lever-Tip-Sample Noncontact Interactions -- 13.6. Experimental Results for the Contact Mode -- References -- Index. 330 8 $aIncludes information about the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. This book also includes research in SFM and a bibliography. It will be useful for academic and industrial researchers using SFM. 410 0$aOxford series in optical and imaging sciences ;$v5. 410 0$aOxford scholarship online. 606 $aScanning force microscopy 606 $aSurfaces (Physics) 615 0$aScanning force microscopy. 615 0$aSurfaces (Physics) 676 $a502.82 700 $aSarid$b Dror$0745994 801 0$bUk 801 1$bUk 801 2$bStDuBDSZ 801 2$bStDuBDSZ 906 $aBOOK 912 $a9910953576703321 996 $aScanning force microscopy$91488437 997 $aUNINA