LEADER 04362nam 22006375 450 001 9910898592603321 005 20241120175117.0 010 $a9783031717239 010 $a3031717236 024 7 $a10.1007/978-3-031-71723-9 035 $a(CKB)36377314700041 035 $a(DE-He213)978-3-031-71723-9 035 $a(MiAaPQ)EBC31850547 035 $a(Au-PeEL)EBL31850547 035 $a(OCoLC)1490381072 035 $a(EXLCZ)9936377314700041 100 $a20241018d2025 u| 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aSingle-Event Effects, from Space to Accelerator Environments $eAnalysis, Prediction and Hardening by Design /$fby Ygor Quadros de Aguiar, Frédéric Wrobel, Jean-Luc Autran, Rubén García Alía 205 $a1st ed. 2025. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2025. 215 $a1 online resource (X, 141 p. 89 illus., 84 illus. in color.) 311 08$a9783031717222 311 08$a3031717228 327 $aRadiation environments and their effects on electronics -- Introduction to Single-Event Effects -- Single-event effects prediction methodologies -- Radiation Hardness Assurance (RHA) methodologies -- Radiation hardening techniques -- Analysis of RHBD techniques at layout level -- Analysis of RHBD techniques at circuit level -- Hardness improvement based on signal probability -- Conclusions/Future Perspectives. 330 $aThis book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described. Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA. Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies Addresses failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies Reveals novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels Offers readers the first book in which particle accelerator applications will be extensively included in the radiation effects context This is an open access book. 606 $aElectronic circuits 606 $aElectronic circuit design 606 $aAerospace engineering 606 $aAstronautics 606 $aElectronic Circuits and Systems 606 $aElectronics Design and Verification 606 $aAerospace Technology and Astronautics 615 0$aElectronic circuits. 615 0$aElectronic circuit design. 615 0$aAerospace engineering. 615 0$aAstronautics. 615 14$aElectronic Circuits and Systems. 615 24$aElectronics Design and Verification. 615 24$aAerospace Technology and Astronautics. 676 $a621.3815 700 $aAguiar$b Ygor Quadros de$4aut$4http://id.loc.gov/vocabulary/relators/aut$01767460 702 $aWrobel$b Frédéric$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aAutran$b Jean-Luc$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aGarcía Alía$b Rubén$4aut$4http://id.loc.gov/vocabulary/relators/aut 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910898592603321 996 $aSingle-Event Effects, from Space to Accelerator Environments$94212865 997 $aUNINA