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010   $a9784431569404$b(electronic bk.)
010   $z9784431569398
024 7 $a10.1007/978-4-431-56940-4
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101 0 $aeng
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181   $ctxt$2rdacontent
182   $cc$2rdamedia
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200 10$aElectron Nano-imaging $eBasics of Imaging and Diffraction for TEM and STEM /$fby Nobuo Tanaka
205   $a2nd ed. 2024.
210  1$aTokyo :$cSpringer Japan :$cImprint: Springer,$d2024.
215   $a1 online resource (389 pages)
311 08$aPrint version: Tanaka, Nobuo Electron Nano-Imaging Tokyo : Springer Japan,c2024 9784431569398 
320   $aIncludes bibliographical references and index.
327   $aChapter 1 Seeing nanometer-sized world -- Chgapter 2 Structure and imaging of a transmission electron microscope (TEM) -- Chapter 3 Basic theories of TEM imaging -- Chapter 4 Resolution and image contrast of a transmission electron microscope (TEM) -- Chapter 5 What is high-resolution transmission electron microscopy ?.
330   $aIn this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details. This book explains the basis of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. The comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by various kinds of knowledge around electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today?s graduate students and professionals just starting their careers.
606   $aMaterials$xMicroscopy
606   $aMaterials$xAnalysis
606   $aImaging systems
606   $aSpectrum analysis
606   $aNanoscience
606   $aMicroscopy
606   $aImaging Techniques
606   $aCharacterization and Analytical Technique
606   $aSpectroscopy
606   $aNanophysics
615  0$aMaterials$xMicroscopy.
615  0$aMaterials$xAnalysis.
615  0$aImaging systems.
615  0$aSpectrum analysis.
615  0$aNanoscience.
615 14$aMicroscopy.
615 24$aImaging Techniques.
615 24$aCharacterization and Analytical Technique.
615 24$aSpectroscopy.
615 24$aNanophysics.
676   $a502.825
700   $aTanaka$b Nobuo$f1899-1966,$01771938
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
912   $a9910878974803321
996   $aElectron Nano-imaging$94267426
997   $aUNINA