LEADER 05218nam 2200625Ia 450 001 9910876874103321 005 20200520144314.0 010 $a9786612031403 010 $a0-470-82299-6 010 $a0-470-82300-3 035 $a(CKB)1000000000793976 035 $a(EBL)427775 035 $a(OCoLC)476270772 035 $a(SSID)ssj0000302709 035 $a(PQKBManifestationID)11212012 035 $a(PQKBTitleCode)TC0000302709 035 $a(PQKBWorkID)10274667 035 $a(PQKB)11196363 035 $a(MiAaPQ)EBC427775 035 $a(PPN)151760128 035 $a(EXLCZ)991000000000793976 100 $a20080114d2008 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aMaterials characterization $eintroduction to microscopic and spectroscopic methods /$fYang Leng 210 $aSingapore ;$aHoboken, NJ $cJ. Wiley$dc2008 215 $a1 online resource (351 p.) 300 $aDescription based upon print version of record. 311 $a0-470-82298-8 320 $aIncludes bibliographical references and index. 327 $aMATERIALS CHARACTERIZATION Introduction to Microscopic and Spectroscopic Methods; Contents; Preface; 1 Light Microscopy; 1.1 Optical Principles; 1.1.1 Image Formation; 1.1.2 Resolution; 1.1.3 Depth of Field; 1.1.4 Aberrations; 1.2 Instrumentation; 1.2.1 Illumination System; 1.2.2 Objective Lens and Eyepiece; 1.3 Specimen Preparation; 1.3.1 Sectioning; 1.3.2 Mounting; 1.3.3 Grinding and Polishing; 1.3.4 Etching; 1.4 Imaging Modes; 1.4.1 Bright-Field and Dark-Field Imaging; 1.4.2 Phase Contrast Microscopy; 1.4.3 Polarized Light Microscopy; 1.4.4 Nomarski Microscopy 327 $a1.4.5 Fluorescence Microscopy1.5 Confocal Microscopy; 1.5.1 Working Principles; 1.5.2 Three-Dimensional Images; References; Questions; 2 X-ray Diffraction Methods; 2.1 X-ray Radiation; 2.1.1 Generation of X-rays; 2.1.2 X-ray Absorption; 2.2 Theoretical Background of Diffraction; 2.2.1 Diffraction Geometry; 2.2.2 Diffraction Intensity; 2.3 X-ray Diffractometry; 2.3.1 Instrumentation; 2.3.2 Samples and Data Acquisition; 2.3.3 Distortions of Diffraction Spectra; 2.3.4 Applications; 2.4 Wide Angle X-ray Diffraction and Scattering; 2.4.1 Wide Angle Diffraction; 2.4.2 Wide Angle Scattering 327 $aReferencesQuestions; 3 Transmission Electron Microscopy; 3.1 Instrumentation; 3.1.1 Electron Sources; 3.1.2 Electromagnetic Lenses; 3.1.3 Specimen Stage; 3.2 Specimen Preparation; 3.2.1 Pre-Thinning; 3.2.2 Final Thinning; 3.3 Image Modes; 3.3.1 Mass-Density Contrast; 3.3.2 Diffraction Contrast; 3.3.3 Phase Contrast; 3.4 Selected Area Diffraction; 3.4.1 Selected Area Diffraction Characteristics; 3.4.2 Single-Crystal Diffraction; 3.4.3 Multi-Crystal Diffraction; 3.4.4 Kikuchi Lines; 3.5 Images of Crystal Defects; 3.5.1 Wedge Fringe; 3.5.2 Bending Contours; 3.5.3 Dislocations; References 327 $aQuestions4 Scanning Electron Microscopy; 4.1 Instrumentation; 4.1.1 Optical Arrangement; 4.1.2 Signal Detection; 4.1.3 Probe Size and Current; 4.2 Contrast Formation; 4.2.1 ElectronSpecimen Interactions; 4.2.2 Topographic Contrast; 4.2.3 Compositional Contrast; 4.3 Operational Variables; 4.3.1 Working Distance and Aperture Size; 4.3.2 Acceleration Voltage and Probe Current; 4.3.3 Astigmatism; 4.4 Specimen Preparation; 4.4.1 Preparation for Topographic Examination; 4.4.2 Preparation for Micro-Composition Examination; 4.4.3 Dehydration; References; Questions; 5 Scanning Probe Microscopy 327 $a5.1 Instrumentation5.1.1 Probe and Scanner; 5.1.2 Control and Vibration Isolation; 5.2 Scanning Tunneling Microscopy; 5.2.1 Tunneling Current; 5.2.2 Probe Tips and Working Environments; 5.2.3 Operational Modes; 5.2.4 Typical Applications; 5.3 Atomic Force Microscopy; 5.3.1 Near-Field Forces; 5.3.2 Force Sensors; 5.3.3 Operational Modes; 5.3.4 Typical Applications; 5.4 Image Artifacts; 5.4.1 Tip; 5.4.2 Scanner; 5.4.3 Vibration and Operation; References; Questions; 6 X-ray Spectroscopy for Elemental Analysis; 6.1 Features of Characteristic X-rays; 6.1.1 Types of Characteristic X-rays 327 $a6.1.2 Comparison ofK,L andM Series 330 $aThis book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fl 606 $aMaterials 606 $aMaterials$xAnalysis 615 0$aMaterials. 615 0$aMaterials$xAnalysis. 676 $a620.1/1 676 $a620.11 676 $a620.1127 700 $aLeng$b Y$g(Yang)$0481056 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910876874103321 996 $aMaterials characterization$9254303 997 $aUNINA