LEADER 05825nam 22007933u 450 001 9910876507903321 005 20230120025610.0 010 $a1-282-34294-0 010 $a9786612342943 010 $a0-470-72712-8 010 $a0-470-72713-6 035 $a(CKB)1000000000520026 035 $a(EBL)470287 035 $a(OCoLC)232611467 035 $a(SSID)ssj0000303232 035 $a(PQKBManifestationID)11210476 035 $a(PQKBTitleCode)TC0000303232 035 $a(PQKBWorkID)10275320 035 $a(PQKB)10373254 035 $a(MiAaPQ)EBC470287 035 $a(MiAaPQ)EBC6992864 035 $a(EXLCZ)991000000000520026 100 $a20160215d2008|||| u|| | 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aMicrostructural Characterization of Materials$b[electronic resource] 205 $a2nd ed. 210 $aHoboken $cWiley$d2008 215 $a1 online resource (554 p.) 225 0 $aQuantitative software engineering series Microstructural characterization of materials 300 $aDescription based upon print version of record. 311 $a0-470-02784-3 327 $aMicrostructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals 327 $a2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane 327 $a2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses 327 $a3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation 327 $a3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast 327 $a4.3.2 Diffraction Contrast and Crystal Lattice Defects 330 $aMicrostructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.

Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental met 606 $aElectronic books. -- local 606 $aMaterials -- Microscopy 606 $aMicrostructure 606 $aMaterials$xMicroscopy 606 $aMicrostructure 606 $aMaterials Science$2HILCC 606 $aChemical & Materials Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 4$aElectronic books. -- local. 615 4$aMaterials -- Microscopy. 615 4$aMicrostructure. 615 0$aMaterials$xMicroscopy 615 0$aMicrostructure 615 7$aMaterials Science 615 7$aChemical & Materials Engineering 615 7$aEngineering & Applied Sciences 676 $a620.1/1299 700 $aBrandon$b David$0747018 701 $aKaplan$b Wayne D$0747019 701 $aBrandon$b D. G$01754074 801 0$bAU-PeEL 801 1$bAU-PeEL 801 2$bAU-PeEL 906 $aBOOK 912 $a9910876507903321 996 $aMicrostructural Characterization of Materials$94190229 997 $aUNINA