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200 10$aICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan
210 31$a[Place of publication not identified]$cIEEE$d2004
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-8262-5 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aSemiconductors$xTesting$vCongresses
606   $aElectronic apparatus and appliances$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aSemiconductors$xTesting
615  0$aElectronic apparatus and appliances$xTesting
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
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712 02$aIEEE Electron Devices Society
712 12$aIEEE International Conference on Microelectronic Test Structures
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996   $aICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan$92538029
997   $aUNINA