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101 0 $aeng
181   $ctxt
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183   $acr
200 10$aITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA
210 31$a[Place of publication not identified]$cInternational Test Conference$d2001
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-7803-7169-0 
606   $aIntegrated circuits$xTesting$vCongresses
606   $aElectronic digital computers$xCircuits$xTesting$vCongresses
606   $aTelecommunication$vCongresses
606   $aRadio frequency$vCongresses
606   $aElectrical Engineering$2HILCC
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIntegrated circuits$xTesting
615  0$aElectronic digital computers$xCircuits$xTesting
615  0$aTelecommunication
615  0$aRadio frequency
615  7$aElectrical Engineering
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
676   $a621.3815/48
712 02$aInstitute of Electrical and Electronics Engineers Philadelphia Section.
712 02$aIEEE Computer Society Test Technology Technical Committee
712 12$aInternational Test Conference
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872966803321
996   $aITC : International Test Conference 2001 : proceedings : October 30-November 1, 2001, Baltimore, MD, USA$92534764
997   $aUNINA