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200 10$aInternational Test Conference, 1991 : proceedings
210 31$a[Place of publication not identified]$cThe Conference$d1991
300   $aBibliographic Level Mode of Issuance: Monograph
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606   $aIntegrated circuits$xTesting$vCongresses
606   $aAutomatic test equipment$vCongresses
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606   $aEngineering & Applied Sciences$2HILCC
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615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
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712 02$aInstitute of Electrical and Electronics Engineers
712 12$aInternational Test Conference
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996   $aInternational Test Conference, 1991 : proceedings$92495144
997   $aUNINA