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101 0 $aeng
181   $ctxt
182   $cc
183   $acr
200 10$a1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California
210 31$a[Place of publication not identified]$cIEEE Computer Society Press$d1998
300   $aBibliographic Level Mode of Issuance: Monograph
311   $a0-8186-9191-3 
606   $aIddq testing$xCongresses
606   $aMetal oxide semiconductors, Complementary$xTesting$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aElectrical Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
615  0$aIddq testing$xCongresses.
615  0$aMetal oxide semiconductors, Complementary$xTesting
615  7$aElectrical & Computer Engineering
615  7$aElectrical Engineering
615  7$aEngineering & Applied Sciences
676   $a621.39/5/0287
702   $aMalaiya$b Yashwant K
702   $aMenon$b Sankaran M
712 02$aIEEE Computer Society Technical Test Technology Committee.
712 12$aIEEE International Workshop on IDDQ Testing
801  0$bPQKB
906   $aPROCEEDING
912   $a9910872838803321
996   $a1998 IEEE International Workshop on IDDQ Testing : proceedings : November 12-13, 1998, San Jose, California$92389606
997   $aUNINA