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101 0 $aeng
181   $ctxt
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183   $acr
200 10$aProceedings (IEEE International Conference on Microelectronic Systems Education (2001 : Las Vegas, Nev.))
210 31$a[Place of publication not identified]$cIEEE Computer Society$d2001
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9780769511566 
311 08$a0769511562 
606   $aMicroelectronics$xStudy and teaching$vCongresses
606   $aComputer science$xStudy and teaching$vCongresses
606   $aElectrical & Computer Engineering$2HILCC
606   $aEngineering & Applied Sciences$2HILCC
606   $aElectrical Engineering$2HILCC
615  0$aMicroelectronics$xStudy and teaching
615  0$aComputer science$xStudy and teaching
615  7$aElectrical & Computer Engineering
615  7$aEngineering & Applied Sciences
615  7$aElectrical Engineering
676   $a621.381/07/1
712 02$aIEEE Computer Society Test Technology Committee.
712 02$aIEEE Computer Society Design Automation Technical Committee
712 02$aIEEE Computer Society Technical Committee on VLSI,
712 12$aIEEE International Conference on Microelectronic Systems Education
801  0$bPQKB
906   $aPROCEEDING
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996   $aProceedings (IEEE International Conference on Microelectronic Systems Education (2001 : Las Vegas, Nev.))$92345147
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